scholarly journals SEM and TEM Cross-section films Study of Chrysanthemum leucanthemum (Asteraceae) Pollen from Costa Rica

2021 ◽  
Vol 27 (S1) ◽  
pp. 1722-1723
Author(s):  
Guillermina González-Mancera ◽  
Laura E. Gómez-Lizarraga ◽  
Joaquin Morales-García
Keyword(s):  
Costa Rica ◽  
Cross Section ◽  
Sem And Tem ◽  
Chrysanthemum Leucanthemum

A Procedure for Cross Sectioning Specific Semiconductor Devices for Both SEM and TEM Analysis

1990 ◽  
Vol 199 ◽  
Author(s):  
J. P. Benedict ◽  
Ron Anderson ◽  
S. J. Klepeis ◽  
M. Chaker
Keyword(s):  
Cross Section ◽  
Semiconductor Devices ◽  
Sem Analysis ◽  
Total Thickness ◽  
Ion Milling ◽  
Tem Analysis ◽  
Plan View ◽  
Positive Side ◽  
Sem And Tem

ABSTRACTThe procedures described in this paper allow both SEM and TEM analysis to be performed on the same, device specific, semiconductor cross section. In order to accomplish this, a number of tools and fixtures have been constructed that allow the user to polish into the sample to a predetermined plane-of-polish, bisecting the device or feature of interest for SEM analysis. After SEM examination, the specimen is prepared for TEM analysis by first affixing a grid to the just-examined surface, inverting the specimen and parallel-polishing the backside of the specimen until the specimen's total thickness is in the 0.5 to 1.0μm range using the described tools. A subsequent one to ten minute ion milling step cleans the specimen. A very considerable positive side-effectof this method is the nearelimination of artifacts arisingfrom the use of strong chemicals and lengthy ion milling. The method has been extended to the preparation of plan-view device samples and non-semiconductor specimens.

The Salvage Archaeology of a Zoned Bichrome Cemetery, Costa Rica

1972 ◽  
Vol 37 (2) ◽  
pp. 240-245 ◽  
Author(s):  
Frederick W. Lange ◽  
Kristin K. Scheidenhelm
Keyword(s):  
Costa Rica ◽  
Cross Section ◽  
Maya Lowlands ◽  
Late Formative ◽  
Salvage Archaeology

AbstractSalvage operations were carried out at an extensively pot-hunted Zoned Bichrome period (300 B.C. to A.D. 300) cemetery in northwestern Guanacaste Province, Costa Rica. This is the first "pure" Zoned Bichrome site of this type to be studied and yielded a cross-section of ceramics representative of other Late Formative sites in the area and of contact with the Maya lowlands. In addition, it solidified the impression of this period being an entity distinct from subsequent regional developments. This distinction is seen in terms of adaptation to the exploitation of marine mollusca, a pattern not present in Zoned Bichrome sites known at the present time, but very important in succeeding Polychrome periods.

A Cross Section of Central America in Costa RICA

1923 ◽  
Vol 22 (3) ◽  
pp. 95-100
Author(s):  
Robert S. Platt
Keyword(s):  
Costa Rica ◽  
Central America ◽  
Cross Section

XUV Absorption Spectra of Carbon Ions

1988 ◽  
Vol 102 ◽  
pp. 71-73
Author(s):  
E. Jannitti ◽  
P. Nicolosi ◽  
G. Tondello
Keyword(s):  
Absorption Spectra ◽  
Cross Section ◽  
Theoretical Calculations ◽  
Photoionization Cross Section ◽  
Carbon Ions

AbstractThe photoabsorption spectra of the carbon ions have been obtained by using two laser-produced plasmas. The photoionization cross-section of the CV has been absolutely measured and the value at threshold, σ=(4.7±0.5) × 10−19cm2, as well as its behaviour at higher energies agrees quite well with the theoretical calculations.

Elastic Scattering in Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 252-253
Author(s):  
J. Langmore ◽  
M. Isaacson ◽  
J. Wall ◽  
A. V. Crewe
Keyword(s):  
Electron Microscopy ◽  
Elastic Scattering ◽  
Cross Section ◽  
Quantum Noise ◽  
Dark Field ◽  
Elastic Cross Section ◽  
Biological Molecules ◽  
Dark Field Microscopy ◽  
Field Systems ◽  
Effects Of Radiation

High resolution dark field microscopy is becoming an important tool for the investigation of unstained and specifically stained biological molecules. Of primary consideration to the microscopist is the interpretation of image Intensities and the effects of radiation damage to the specimen. Ignoring inelastic scattering, the image intensity is directly related to the collected elastic scattering cross section, σɳ, which is the product of the total elastic cross section, σ and the eficiency of the microscope system at imaging these electrons, η. The number of potentially bond damaging events resulting from the beam exposure required to reduce the effect of quantum noise in the image to a given level is proportional to 1/η. We wish to compare η in three dark field systems.

A New Approach to the Demonstration of Oxidase-Localization Using Tannic Acid Or Catechin

1973 ◽  
Vol 31 ◽  
pp. 698-699
Author(s):  
V. Mizuhira ◽  
Y. Futaesaku
Keyword(s):  
Cross Section ◽  
Tannic Acid ◽  
Elastic Fiber ◽  
The Other ◽  
New Approach ◽  
Tissue Block ◽  
Active Reaction ◽  
The Cross

Previously we reported that tannic acid is a very effective fixative for proteins including polypeptides. Especially, in the cross section of microtubules, thirteen submits in A-tubule and eleven in B-tubule could be observed very clearly. An elastic fiber could be demonstrated very clearly, as an electron opaque, homogeneous fiber. However, tannic acid did not penetrate into the deep portion of the tissue-block. So we tried Catechin. This shows almost the same chemical natures as that of proteins, as tannic acid. Moreover, we thought that catechin should have two active-reaction sites, one is phenol,and the other is catechole. Catechole site should react with osmium, to make Os- black. Phenol-site should react with peroxidase existing perhydroxide.

Electron Irradiation Effects in Polyoxymethylene Crystals Grown Inside Trioxane Crystals

1971 ◽  
Vol 29 ◽  
pp. 78-79
Author(s):  
J. P. Colson ◽  
D. H. Reneker
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Detailed Examination ◽  
The Other ◽  
Electron Micrograph ◽  
Irradiation Effects ◽  
Threefold Axis ◽  
Typical Sample ◽  
Polymer Crystals ◽  
Chain Axis

Polyoxymethylene (POM) crystals grow inside trioxane crystals which have been irradiated and heated to a temperature slightly below their melting point. Figure 1 shows a low magnification electron micrograph of a group of such POM crystals. Detailed examination at higher magnification showed that three distinct types of POM crystals grew in a typical sample. The three types of POM crystals were distinguished by the direction that the polymer chain axis in each crystal made with respect to the threefold axis of the trioxane crystal. These polyoxymethylene crystals were described previously.At low magnifications the three types of polymer crystals appeared as slender rods. One type had a hexagonal cross section and the other two types had rectangular cross sections, that is, they were ribbonlike.

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