scholarly journals Atom Probe Tomography Defines Mainstream Microscopy at the Atomic Scale

2006 ◽  
Vol 14 (4) ◽  
pp. 34-41 ◽  
Author(s):  
Thomas F. Kelly ◽  
Keith Thompson ◽  
Emmanuelle A. Marquis ◽  
David J. Larson
Keyword(s):  
Atom Probe Tomography ◽  
Scanning Tunneling Microscope ◽  
Atom Probe ◽  
Atomic Scale ◽  
Process Equipment ◽  
Scanning Tunneling ◽  
Surface Scanning ◽  
Single Atoms ◽  
Transmission Electron ◽  
Electron Microscopes

When making a sculpture, it is the eyes that guide the hands and tools and perceive the outcome. In simple words, “in order to make, you must be able to see.” So too, when making a nanoelectronic device, it is the microscope (eyes) that guides the process equipment (hands and tools) and perceives the outcome. As we emerge into the century of nanotechnology, it is imperative that the eyes on the nanoworld provide an adequate ability to “see.” We have microscopies that resolve 0.02 nm on a surface (scanning tunneling microscope (STM)) or single atoms in a specimen (atom probe tomographs (APT) and transmission electron microscopes (TEM)).

Atom Probe Microscopy and its Future

1994 ◽  
Vol 332 ◽  
Author(s):  
T. F. Kelly ◽  
P. P. Camus ◽  
D. J. Larson ◽  
L. M. Holzman
Keyword(s):  
Materials Science ◽  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Level ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Probe Field ◽  
Transmission Electron ◽  
Indispensable Tool ◽  
3D Information

ABSTRACTMuch of the current activity and excitement in materials science involves processing and understanding materials at the atomic scale. Accordingly, it is necessary for materials scientists to control and characterize materials at the atomic level. There are only a few microscopies that are capable of providing information about the structure of materials at the atomic level: the atom probe field ion microscope, the high resolution transmission electron microscope, and the scanning tunneling microscope. The three-dimensional atom probe (3DAP) determines the 3D location and elemental identity of each atom in a sample. It is the only technique that provides 3D information at the atomic scale.The origin and underlying concepts behind the 3DAP are described. Several examples of actual images from existing 3DAPs are shown with emphasis on nanometer-scale analysis. Current limitations of the technique and expected future developments in this form of microscopy are described. It is our opinion that 3D atomic-scale imaging will be an indispensable tool in materials science in the coming decades.

Atomic-Scale Tomography: A 2020 Vision

2013 ◽  
Vol 19 (3) ◽  
pp. 652-664 ◽  
Author(s):  
Thomas F. Kelly ◽  
Michael K. Miller ◽  
Krishna Rajan ◽  
Simon P. Ringer
Keyword(s):  
Electron Microscopy ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale ◽  
Multidimensional Data ◽  
Materials Engineering ◽  
Transmission Electron ◽  
Integrated Computational Materials Engineering ◽  
Computational Materials ◽  
Structure Properties

AbstractAtomic-scale tomography (AST) is defined and its place in microscopy is considered. Arguments are made that AST, as defined, would be the ultimate microscopy. The available pathways for achieving AST are examined and we conclude that atom probe tomography (APT) may be a viable basis for AST on its own and that APT in conjunction with transmission electron microscopy is a likely path as well. Some possible configurations of instrumentation for achieving AST are described. The concept of metaimages is introduced where data from multiple techniques are melded to create synergies in a multidimensional data structure. When coupled with integrated computational materials engineering, structure–properties microscopy is envisioned. The implications of AST for science and technology are explored.

scholarly journals Atomic Scale Composition Profiling of Ferroelectrics via Laser-Pulsed Atom Probe Tomography and Cross-Correlative Transmission Electron Microscopy

2013 ◽  
Vol 19 (S2) ◽  
pp. 980-981 ◽  
Author(s):  
R. Kirchhofer ◽  
D.R. Diercks ◽  
B.P. Gorman ◽  
G.L. Brennecka
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atom Probe Tomography ◽  
Atom Probe ◽  
Atomic Scale ◽  
Transmission Electron ◽  
Scale Composition

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Chemical and Structural Characterization of γ/γ′ Interfaces

2012 ◽  
Vol 463-464 ◽  
pp. 20-24
Author(s):  
Kai Zhao
Keyword(s):  
Atom Probe Tomography ◽  
Three Dimensional ◽  
Atom Probe ◽  
Scanning Transmission Electron Microscope ◽  
Atomic Scale ◽  
X Ray ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Nickel Base

More attention has been paid to the interfaces since mechanical properties of nickel-base superalloys are determined to some degree by them. The compositional transition across γ/γ′ interfaces and atomic structure of the interfaces was investigated using three-dimensional atom probe tomography and scanning transmission electron microscope equipped with high-resolution Energy Dispersive X-ray Spectrometry. Results show that no obvious segregation to the interfaces or ledges of the precipitates in the present experimental alloys has been observed. Also, adsorption of a solute to the interface was not observed. The interfaces are not flat as usually thought at an atomic scale. The interfacial thickness is about two atomic layers, i.e. 0.7 nm.

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