scholarly journals Design and Construction of an Optical TEM Specimen Holder

2021 ◽  
Vol 29 (5) ◽  
pp. 40-44
Author(s):  
Joel Martis ◽  
Ze Zhang ◽  
Hao-Kun Li ◽  
Ann Marshall ◽  
Roy Kim ◽  
...  
Keyword(s):  
Energy Resolution ◽  
High Energy ◽  
High Energy Resolution ◽  
Nanometer Scale ◽  
Specimen Holder ◽  
Spectrally Selective ◽  
Transmission Electron ◽  
Spectroscopic Information ◽  
Resolution Imaging ◽  
Electron Microscopes

Abstract:Electron microscopy has enabled atomic resolution imaging of matter. However, unlike optical spectroscopic imaging, traditional electron microscopes provide limited spectroscopic information in terms of their energy resolution. Only recently, owing to advances in monochromated STEM-EELS, have transmission electron microscopes (TEMs) been able to attain a high energy resolution. We recently proposed combining spectrally selective photoexcitation with HRTEM to achieve sub-nanometer scale optical imaging, a technique we called photoabsorption microscopy using electron analysis (PAMELA). To realize PAMELA-TEM experimentally, we constructed a TEM holder with an optical feedthrough, capable of photoexciting materials with different wavelengths. In this article, we describe our process for designing and fabricating an optical TEM specimen holder, highlighting important aspects of the design.

scholarly journals Ghost imaging with electron microscopy inspired, non-orthogonal phase masks

2021 ◽  
Author(s):  
Akhil Kallepalli ◽  
Daan Stellinga ◽  
Ming-Jie Sun ◽  
Richard Bowman ◽  
Enzo Rotunno ◽  
...  
Keyword(s):  
High Resolution ◽  
Imaging Techniques ◽  
High Energy ◽  
Reconstruction Method ◽  
Ghost Imaging ◽  
Light Modulator ◽  
Transmission Electron ◽  
Resolution Imaging ◽  
Electron Microscopes ◽  
Energy Processes

Abstract Transmission electron microscopes (TEM) achieve high resolution imaging by raster scanning a focused beam of electrons over the sample and measuring the transmission to form an image. While a TEM can achieve a much higher resolution than optical microscopes, they face challenges of damage to samples during the high energy processes involved. Here, we explore the possibility of applying computational ghost imaging techniques adapted from the optical regime to reduce the total, required illumination intensity. The technological lack of the equivalent high-resolution, optical spatial light modulator for electrons means that a different approach needs to be pursued. Using the optical equivalent, we show that a simple six-needle charged device to modulate the illuminating beam, alongside a novel reconstruction method to handle the resulting highly non-orthogonal patterns, is capable of producing images comparable in quality to a raster-scanned approach with much lower peak intensity.

Energy-Filtered CTEM Image of MgO Smoke Particles

1985 ◽  
Vol 43 ◽  
pp. 410-411
Author(s):  
Y. Kondo ◽  
T. Yoshioka ◽  
T. Oikawa ◽  
Y. Kokubo ◽  
M. Kersker
Keyword(s):  
Electron Microscope ◽  
Energy Resolution ◽  
Transmission Electron Microscope ◽  
High Energy ◽  
Scanning Transmission Electron Microscope ◽  
High Energy Resolution ◽  
Energy Analyzer ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Sector Type

The energy filtered imaging technique has so far been carried out in a scanning transmission electron microscope (STEM) fitted with a sector type energy analyzer. The STEM has a disadvantage of low beam parallelity because it uses a convergent beam, while the conventional transmission electron microscope (CTEM) allows good phase contrast and diffraction contrast to be obtained because of the high parallelity of the beam, and allows also high resolution images to be obtained. The technique to obtain energy filtered CTEM images has thus far been carried out by a Castaing-Henry type filter or an Ω type filter. However, these filters have the disadvantage of lower energy resolution than conventional sector type energy analyzer at the present time. This paper reports energy filtered CTEM images of MgO smoke, obtained using a new scanning CTEM image technique and a high energy resolution sector type energy analyzer which can resolve bulk and surface plasmon energy.

A High Energy-resolution Wavelength-dispersive Soft-X-ray Spectrometer for a Transmission Electron Microscope to Investigate Valence Electrons

2004 ◽  
Vol 10 (S02) ◽  
pp. 1044-1045 ◽  
Author(s):  
Masami Terauchi
Keyword(s):  
Electron Microscope ◽  
Energy Resolution ◽  
Transmission Electron Microscope ◽  
High Energy ◽  
High Energy Resolution ◽  
X Ray ◽  
Transmission Electron ◽  
Valence Electrons

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Investigation of low-loss spectra and near-edge fine structure of polymers by peels

1996 ◽  
Vol 54 ◽  
pp. 158-159
Author(s):  
W. Heckmann
Keyword(s):  
Electron Microscopy ◽  
High Sensitivity ◽  
High Energy ◽  
High Energy Resolution ◽  
Imaging Method ◽  
Low Loss ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Electron Energy Loss ◽  
Loss Range

Transmission electron microscopy has changed from a purely imaging method to an analytical method. This has been facilitated particularly by equipping electron microscopes with energy filters and with parallel electron energy loss spectrometers (PEELS). Because of their relatively high energy resolution (1 to 2 eV) they provide information not only on the elements present but also on the type of bonds between the molecular groups. Polymers are radiation sensitive and the molecular bonds change as the spectrum is being recorded. This can be observed with PEEL spectrometers that are able to record spectra with high sensitivity and in rapid succession.A PEEL spectrum can be divided into a low loss range and an inner shell loss range of higher energy. The low loss spectra of polymers always show a broad peak at about 22 eV and a further peak at 7 eV, if aromatic groups are present, as is the case with PS (Fig. 1). In the course of exposure, the intensity of this peak decreases, a sign that the benzene ring is destroyed by the radiation (Fig. 2).

Practical X-ray Spectrometry with Second-Generation Microcalorimeter Detectors

2012 ◽  
Vol 20 (4) ◽  
pp. 38-42 ◽  
Author(s):  
Robin Cantor ◽  
Hideo Naito
Keyword(s):  
Electron Microscope ◽  
Spatial Resolution ◽  
Energy Resolution ◽  
Semiconductor Industry ◽  
High Energy ◽  
High Energy Resolution ◽  
X Rays ◽  
X Ray ◽  
Analytical Technique ◽  
Transmission Electron

X-ray spectroscopy is a widely used and extremely sensitive analytical technique for qualitative as well as quantitative elemental analysis. Typically, high-energy-resolution X-ray spectrometers are integrated with a high-spatial-resolution scanning electron microscope (SEM) or transmission electron microscope (TEM) for X-ray microanalysis applications. The focused electron beam of the SEM or TEM excites characteristic X rays that are emitted by the sample. The integrated X-ray spectrometer can then be used to identify and quantify the elemental composition of the sample on a sub-micron length scale. This combination of energy resolution and spatial resolution makes X-ray microanalysis of great importance to the semiconductor industry.

Localization of Green Fluorescent Protein Absorbance by Energy Filtered Transmission Electron Microscopy

2000 ◽  
Vol 6 (S2) ◽  
pp. 324-325
Author(s):  
J. A. Davis ◽  
R. G. Garces ◽  
J.-Y. Diao ◽  
F. P. Ottensmeyer
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Green Fluorescent Protein ◽  
Energy Loss ◽  
Energy Resolution ◽  
Fluorescent Protein ◽  
High Energy ◽  
High Energy Resolution ◽  
Transmission Electron ◽  
Green Fluorescent

Energy filtered transmission electron microscopy has the potential to provide high resolution, spatially resolved, atomic and chemical information. However, aberrations generated by the electron spectrometer blur the energy resolution and limit the atomic or molecular distributions that can be studied. Energy absorptions corresponding to the visible light range fall below an energy loss of 5 eV. The selection of electrons that have lost an amount of energy corresponding to chromophore absorption by the sample thus requires a spectrometer with a high energy resolution over the full image plane. A corrected prism-mirror-prism filter that has a resolution of 1.1 eV, sufficient to select these low energy loss electrons, was developed and installed by us in a Zeiss EM902. Its imaging capability was verified for a number of different chromophores. The chromophore currently under study is that of the green fluorescent protein (GFP).

High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy

2009 ◽  
Vol 367 (1903) ◽  
pp. 3683-3697 ◽  
Author(s):  
Ondrej L. Krivanek ◽  
Jonathan P. Ursin ◽  
Neil J. Bacon ◽  
George J. Corbin ◽  
Niklas Dellby ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Energy Resolution ◽  
Electron Energy Loss Spectroscopy ◽  
High Energy ◽  
High Energy Resolution ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Energy Loss

An all-magnetic monochromator/spectrometer system for sub-30 meV energy-resolution electron energy-loss spectroscopy in the scanning transmission electron microscope is described. It will link the energy being selected by the monochromator to the energy being analysed by the spectrometer, without resorting to decelerating the electron beam. This will allow it to attain spectral energy stability comparable to systems using monochromators and spectrometers that are raised to near the high voltage of the instrument. It will also be able to correct the chromatic aberration of the probe-forming column. It should be able to provide variable energy resolution down to approximately 10 meV and spatial resolution less than 1 Å.

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