In situ cleaning and activation of solid electrode surfaces by pulsed laser light

1984 ◽  
Vol 56 (12) ◽  
pp. 2256-2257 ◽  
Author(s):  
Elise. Hershenhart ◽  
Richard L. McCreery ◽  
Randall D. Knight
Keyword(s):  
Laser Light ◽  
Pulsed Laser ◽  
Solid Electrode ◽  
Electrode Surfaces

Holographic moving picture recording and observation of ultrashort pulsed laser light propagation

2008 ◽  
Vol 36 (Supplement) ◽  
pp. 201-202
Author(s):  
Yasuhiro Awatsuji ◽  
Kenzo Nishio ◽  
Shogo Ura ◽  
Toshihiro Kubota
Keyword(s):  
Light Propagation ◽  
Laser Light ◽  
Pulsed Laser ◽  
Ultrashort Pulsed Laser

In-Situ Dual-Wavelength Ellipsometry and Light Scattering Monitoring of Si/Si1−xGex Heterostructures and Multiuantum Wells

1993 ◽  
Vol 324 ◽  
Author(s):  
C. Pickering ◽  
D.A.O. Hope ◽  
W.Y. Leong ◽  
D.J. Robbins ◽  
R. Greef
Keyword(s):  
Growth Rate ◽  
Light Scattering ◽  
Laser Light ◽  
Growth Period ◽  
Laser Light Scattering ◽  
Heterojunction Bipolar Transistor ◽  
Dual Wavelength ◽  
Multi Quantum Well ◽  
Refractive Index Data

AbstractIn-situ dual-wavelength ellipsometry and laser light scattering have been used to monitor growth of Si/Si1−x,Gex heterojunction bipolar transistor and multi-quantum well (MQW) structures. The growth rate of B-doped Si0 8Ge0.2 has been shown to be linear, but that of As-doped Si is non-linear, decreasing with time. Refractive index data have been obtained at the growth temperature for x = 0.15, 0.20, 0.25. Interface regions ∼ 6-20Å thickness have been detected at hetero-interfaces and during interrupted alloy growth. Period-to-period repeatability of MQW structures has been shown to be ±lML.

In situ deposition of ErNi2B2C films by pulsed laser ablation technique

1998 ◽  
Vol 299 (1-2) ◽  
pp. 15-22 ◽  
Author(s):  
A Canesi ◽  
M.R Cimberle ◽  
C Ferdeghini ◽  
A Diaspro ◽  
P Guasconi ◽  
...  
Keyword(s):  
Laser Ablation ◽  
Pulsed Laser ◽  
Pulsed Laser Ablation ◽  
Ablation Technique ◽  
In Situ Deposition ◽  
Laser Ablation Technique

Low-Fluence Laser Induced Fragmentation and Desorption of 3,4,9,10-Perylenetetracarboxylic Dianhydride (PTCDA) Thin Film

2013 ◽  
Vol 543 ◽  
pp. 30-34 ◽  
Author(s):  
Aljona Ramonova ◽  
Tengiz Butkhuzi ◽  
Viktorija Abaeva ◽  
I.V. Tvauri ◽  
Soslan Khubezhov ◽  
...  
Keyword(s):  
Thin Film ◽  
Carbon Dioxide ◽  
Carbon Monoxide ◽  
Kinetic Energy ◽  
Atomic Oxygen ◽  
Laser Light ◽  
Pulsed Laser ◽  
Molecular Fragmentation ◽  
Irradiation Pulse ◽  
Main Effect

Laser-induced fragmentation and desorption of fragments of PTCDA films vacuum-deposited on GaAs (100) substrate has been studied by time-of-flight (TOF) mass spectroscopy. The main effect caused by pulsed laser light irradiation (pulse duration: 10 ns, photon energy: 2.34 eV and laser fluence ranging from 0.5 to 7 mJ/cm2) is PTCDA molecular fragmentation and desorption of the fragments formed, whereas no desorption of intact PTCDA molecule was detected. Fragments formed are perylene core C20H8, its half C10H4, carbon dioxide, carbon monoxide and atomic oxygen. All desorbing fragments have essentially different kinetic energy. The mechanism of photoinduced molecular fragmentation and desorption is discussed.

scholarly journals An in situ study of reconstructed gold electrode surfaces by second harmonic generation

1989 ◽  
Vol 163 (2-3) ◽  
pp. 123-128 ◽  
Author(s):  
A. Friedrich ◽  
B. Pettinger ◽  
D.M. Kolb ◽  
G. Lüpke ◽  
R. Steinhoff ◽  
...  
Keyword(s):  
Second Harmonic Generation ◽  
Harmonic Generation ◽  
Gold Electrode ◽  
Second Harmonic ◽  
Electrode Surfaces ◽  
In Situ Study
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