Nature of the Trigger Linkage in Explosive Materials Is a Charge-Shift Bond

AbstractThe catalytic properties of nanostructured gold catalyst are known to depend on the size of the gold particles and to be activated when the size decreases to a few nanometers. We investigated the size dependence of the three-dimensional nanostructure on the mean inner potential of gold catalysts supported on titanium oxide using electron holography and high-resolution electron microscopy (HREM). The contact angle of the gold particles on the titanium oxide tended to be over 90° for gold particles with a size of over 5 nm, and below 90° for a size of below 2 nm. This decreasing change in the contact angle (morphology) acts to increase the perimeter and hence the area of the interface between the gold and titanium oxide support, which is considered to be an active site for CO oxidation. The mean inner potential of the gold particles also changed as their size decreased. The value of the inner potential of gold, which is approximately 25 V in bulk state, rose to over 40 V when the size of the gold particles was less than 2 nm. This phenomenon indicates the existence of a charge transfer at the interface between gold and titanium oxide. The 3-D structure change and the inner potential change should be attributed to the specific electronic structure at the interface, owing to both the “nano size effect” and the “hetero-interface effect.”

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Experimental Evaluation of Turbo-Matching Appropriateness of B60J67, B60J68, A58N70 and A58N72 Turbo-Chargers for a Commercial Vehicle Engine

International Journal of Emerging Research in Management and Technology ◽

10.23956/ijermt.v6i11.49 ◽

2018 ◽

Vol 6 (11) ◽

pp. 71

Author(s):

Badal Dev Roy ◽

R. Saravanan

Keyword(s):

Internal Combustion Engines ◽

Perfect Match ◽

Engine Performance ◽

Operating Conditions ◽

Data Logger ◽

Negative Effects ◽

Road Test ◽

The Road ◽

A Charge ◽

All Speeds

The Turbocharger is a charge booster for internal combustion engines to ensure best engine performance at all speeds and road conditions especially at the higher load. Random selection of turbocharger may lead to negative effects like surge and choke in the breathing of the engine. Appropriate selection or match of the turbocharger (Turbomatching) is a tedious task and expensive. But perfect match gives many distinguished advantages and it is a one time task per the engine kind. This study focuses to match the turbocharger to desired engine by simulation and on road test. The objective of work is to find the appropriateness of matching of turbochargers with trim 67 (B60J67), trim 68 (B60J68), trim 70 (A58N70) and trim 72 (A58N72) for the TATA 497 TCIC -BS III engine. In the road-test (data-logger method) the road routes like highway and slope up were considered for evaluation. The operating conditions with respect various speeds, routes and simulated outputs were compared with the help of compressor map.

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DFT investigation of a charge-transfer complex formation between p-phenylenediamine and 3,5-dinitrosalicylic acid

Журнал структурной химии ◽

10.26902/jsc_id51000 ◽

2019 ◽

Vol 60 (12) ◽

Keyword(s):

Charge Transfer ◽

Complex Formation ◽

Charge Transfer Complex ◽

A Charge

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Localization Techniques on a 0.15um CMOS Device: Charge Pump Failure Analysis

ISTFA 2002: Conference Proceedings from the 28th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2002p0771 ◽

2002 ◽

Author(s):

Hui Pan ◽

Thomas Gibson

Keyword(s):

Failure Analysis ◽

Focused Ion Beam ◽

Ion Beam ◽

Electrical Characterization ◽

Charge Pump ◽

Front Side ◽

Pump Failure ◽

Electrical Failure ◽

Optical Proximity Correction ◽

A Charge

Abstract In recent years, there have been many advances in the equipment and techniques used to isolate faults. There are many options available to the failure analyst. The available techniques fall into the categories of electrical, photonic, thermal and electron/ion beam [1]. Each technique has its advantages and its limitations. In this paper, we introduce a case of successful failure analysis using a combination of several fault localization techniques on a 0.15um CMOS device with seven layers of metal. It includes electrical failure mode characterization, front side photoemission, backside photoemission, Focused Ion Beam (FIB), Scanning Electron Microscope (SEM) and liquid crystal. Electrical characterization along with backside photoemission proved most useful in this case as a poly short problem was found to be causing a charge pump failure. A specific type of layout, often referred to as a hammerhead layout, and the use of Optical Proximity Correction (OPC) contributed to the poly level shorts.

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