Rheo-Optical Study on the Viscoelastic Relaxation Modes of a Microgel Particle Suspension around the Liquid–Solid Transition Regime

2021 ◽  
Author(s):  
Li Shangwei ◽  
Osamu Urakawa ◽  
Tadashi Inoue
2012 ◽  
Vol 45 (16) ◽  
pp. 6580-6586 ◽  
Author(s):  
Eiko Tamura ◽  
Yurika Kawai ◽  
Tadashi Inoue ◽  
Hiroshi Watanabe

Author(s):  
Sumio Iijima ◽  
Tung Hsu

Suppose the thickness of a thin film of a crystal varies periodically like a regular array of surface steps, kinematical intensities of diffracted waves from this crystal are modulated by a shape transform,


1988 ◽  
Vol 49 (7) ◽  
pp. 1271-1293 ◽  
Author(s):  
J.C. Earnshaw ◽  
R.C. McGivern ◽  
P.J. Winch

2002 ◽  
Vol 715 ◽  
Author(s):  
N. Wyrsch ◽  
C. Droz ◽  
L. Feitknecht ◽  
J. Spitznagel ◽  
A. Shah

AbstractUndoped microcrystalline silicon samples deposited in the transition regime between amorphous and microcrystalline growth have been investigated by dark conductivity measurement and Raman spectroscopy. From the latter, a semi-quantitative crystalline volume fraction Xc of the sample was deduced and correlated with dark conductivity data in order to reveal possible percolation controlled transport. No threshold was observed around the critical crystalline fraction value Xc of 33%, as reported previously, but a threshold in conductivity data was found at Xc≈50%. This threshold is interpreted here speculatively as being the result of postoxidation, and not constituting an actual percolation threshold.


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