Analysis of the Thermal Degradation Effect on a HfO2-Based Memristor Synapse Caused by Oxygen Affinity of a Top Electrode Metal and on a Neuromorphic System
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2019 ◽
Vol 14
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pp. 155892501984361
2017 ◽
Vol 62
(1-2)
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pp. 63-71
1981 ◽
Vol 42
(C1)
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pp. C1-301-C1-307
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2019 ◽
Vol 35
(3)
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pp. 329-340
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1974 ◽
Vol 33
(3)
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pp. 261-267
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1968 ◽
Vol 21
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pp. 9-15
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