Probing the Correlation of Twin Boundaries and Charge Transport of CdTe Solar Cells Using Electron Backscattering Diffraction and Conductive Atomic Force Microscopy

2018 ◽  
Vol 1 (8) ◽  
pp. 3646-3653 ◽  
Author(s):  
Hui Li ◽  
Paul Harrison ◽  
Judy Wu ◽  
Huijun Yao
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Charge Transport ◽  
Conductive Atomic Force Microscopy ◽  
Twin Boundaries ◽  
Force Microscopy ◽  
Cdte Solar Cells ◽  
Electron Backscattering ◽  
Atomic Force ◽  
Electron Backscattering Diffraction

scholarly journals Charge transport in CdTe solar cells revealed by conductive tomographic atomic force microscopy

Nature Energy ◽  
2016 ◽  
Vol 1 (11) ◽  
Author(s):  
Justin Luria ◽  
Yasemin Kutes ◽  
Andrew Moore ◽  
Lihua Zhang ◽  
Eric A. Stach ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Charge Transport ◽  
Force Microscopy ◽  
Cdte Solar Cells ◽  
Atomic Force

scholarly journals Charge Transport in Intermixed Regions of All-Polymer Solar Cells Studied by Conductive Atomic Force Microscopy

2017 ◽  
Vol 9 (18) ◽  
pp. 15615-15622 ◽  
Author(s):  
Miki Osaka ◽  
Daisuke Mori ◽  
Hiroaki Benten ◽  
Hiroki Ogawa ◽  
Hideo Ohkita ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Charge Transport ◽  
Polymer Solar Cells ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

CdCl2 Treatment-Induced Enhanced Conductivity in CdTe Solar Cells Observed Using Conductive Atomic Force Microscopy

2016 ◽  
Vol 7 (24) ◽  
pp. 4962-4967 ◽  
Author(s):  
Mohit Tuteja ◽  
Antonio B. Mei ◽  
Vasilios Palekis ◽  
Allen Hall ◽  
Scott MacLaren ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Cdte Solar Cells ◽  
Atomic Force ◽  
Cdcl2 Treatment ◽  
Enhanced Conductivity

Emerging Conductive Atomic Force Microscopy for Metal Halide Perovskite Materials and Solar Cells

2020 ◽  
Vol 10 (10) ◽  
pp. 1903922 ◽  
Author(s):  
Haonan Si ◽  
Suicai Zhang ◽  
Shuangfei Ma ◽  
Zhaozhao Xiong ◽  
Ammarah Kausar ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Metal Halide ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Perovskite Materials ◽  
Metal Halide Perovskite ◽  
Halide Perovskite

Electrochemical and atomic force microscopy investigations of the effect of CdS on the local electrical properties of CH3NH3PbI3:CdS perovskite solar cells

2017 ◽  
Vol 5 (46) ◽  
pp. 12112-12120 ◽  
Author(s):  
Mingxuan Guo ◽  
Fumin Li ◽  
Lanyu Ling ◽  
Chong Chen
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Electrochemical Impedance Spectroscopy ◽  
Electrochemical Impedance ◽  
Bulk Heterojunction ◽  
Perovskite Solar Cells ◽  
Kelvin Probe ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

The effect of the incorporated CdS on the local optoelectronic properties of CH3NH3PbI3:CdS bulk heterojunction (BHJ) perovskite solar cells (PSCs) are studied using Kelvin probe force microscopy (KPFM), conductive atomic force microscopy (c-AFM) and electrochemical impedance spectroscopy (EIS).

scholarly journals Improved Electrical and Structural Stability in HTL-Free Perovskite Solar Cells by Vacuum Curing Treatment

Energies ◽  
2020 ◽  
Vol 13 (15) ◽  
pp. 3953
Author(s):  
Salvatore Valastro ◽  
Emanuele Smecca ◽  
Salvatore Sanzaro ◽  
Filippo Giannazzo ◽  
Ioannis Deretzis ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Structural Stability ◽  
Perovskite Solar Cells ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Hole Transporting ◽  
Top Contact ◽  
Proper Material

Device engineering with proper material integration into perovskite solar cells (PSCs) would extend their durability provided a special care is spent to retain interface integrity during use. In this paper, we propose a method to preserve the perovskite (PSK) surface from solvent-mediated modification and damage that can occur during the deposition of a top contact and furtherly during operation. Our scheme used a hole transporting layer-free top-contact made of Carbon (mostly graphite) to the side of hole extraction. We demonstrated that the PSK/graphite interface benefits from applying a vacuum-curing step after contact deposition that allowed mitigating the loss in efficiency of the solar devices, as well as a full recovery of the electrical performances after device storage in dry nitrogen and dark conditions. The device durability compared to reference devices was tested over 90 days. Conductive atomic force microscopy (CAFM) disclosed an improved surface capability to hole exchange under the graphite contact after vacuum curing treatment.

scholarly journals Non-Fullerene Small Molecule Electron-Transporting Materials for Efficient p-i-n Perovskite Solar Cells

Nanomaterials ◽  
2020 ◽  
Vol 10 (6) ◽  
pp. 1082
Author(s):  
Da-Seul Choi ◽  
Sung-Nam Kwon ◽  
Seok-In Na
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Electron Transport ◽  
Perovskite Solar Cells ◽  
Internal Resistance ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Many ◽  
Low Coverage

PC61BM is commonly used in perovskite solar cells (PSC) as the electron transport material (ETM). However, PC61BM film has various disadvantages, such as its low coverage or the many pinholes that appear due to its aggregation behavior. These faults may lead to undesirable direct contact between the metal cathode and perovskite film, which could result in charge recombination at the perovskite/metal interface. In order to overcome this problem, three alternative non-fullerene electron materials were applied to inverted PSCs; they were evaluated on suitability as electron transport layers. The roles and effects of these non-fullerene ETMs on device performance were studied using photoluminescence (PL) measurements, field emission scanning electron microscopy (FE-SEM), atomic force microscopy (AFM), internal resistance in PSC measurements, and conductive atomic force microscopy (C-AFM). It was found that one of the tested materials, IT-4f, showed excellent electron extraction ability and was associated with reduced recombination. The PSC with IT-4f as the ETM produced better cell-performance; it had an average PCE of 11.21%, which makes it better than the ITIC and COi8DFIC-based devices. Finally, IT-4f was compared with PC61BM; it was found that the two materials have quite comparable efficiency and stability levels.

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