Direct Observation of Crystal Engineering in Perovskite Solar Cells in a Moisture-Free Environment Using Conductive Atomic Force Microscopy and Friction Force Microscopy

2020 ◽  
Vol 124 (9) ◽  
pp. 4946-4952
Author(s):  
Kunsik An ◽  
Seunghyun Rhee ◽  
Hyunho Lee ◽  
Kyung-Tae Kang ◽  
Changhee Lee ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Friction Force ◽  
Crystal Engineering ◽  
Perovskite Solar Cells ◽  
Friction Force Microscopy ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Free Environment

Electrochemical and atomic force microscopy investigations of the effect of CdS on the local electrical properties of CH3NH3PbI3:CdS perovskite solar cells

2017 ◽  
Vol 5 (46) ◽  
pp. 12112-12120 ◽  
Author(s):  
Mingxuan Guo ◽  
Fumin Li ◽  
Lanyu Ling ◽  
Chong Chen
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Electrochemical Impedance Spectroscopy ◽  
Electrochemical Impedance ◽  
Bulk Heterojunction ◽  
Perovskite Solar Cells ◽  
Kelvin Probe ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

The effect of the incorporated CdS on the local optoelectronic properties of CH3NH3PbI3:CdS bulk heterojunction (BHJ) perovskite solar cells (PSCs) are studied using Kelvin probe force microscopy (KPFM), conductive atomic force microscopy (c-AFM) and electrochemical impedance spectroscopy (EIS).

scholarly journals Improved Electrical and Structural Stability in HTL-Free Perovskite Solar Cells by Vacuum Curing Treatment

Energies ◽  
2020 ◽  
Vol 13 (15) ◽  
pp. 3953
Author(s):  
Salvatore Valastro ◽  
Emanuele Smecca ◽  
Salvatore Sanzaro ◽  
Filippo Giannazzo ◽  
Ioannis Deretzis ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Structural Stability ◽  
Perovskite Solar Cells ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Hole Transporting ◽  
Top Contact ◽  
Proper Material

Device engineering with proper material integration into perovskite solar cells (PSCs) would extend their durability provided a special care is spent to retain interface integrity during use. In this paper, we propose a method to preserve the perovskite (PSK) surface from solvent-mediated modification and damage that can occur during the deposition of a top contact and furtherly during operation. Our scheme used a hole transporting layer-free top-contact made of Carbon (mostly graphite) to the side of hole extraction. We demonstrated that the PSK/graphite interface benefits from applying a vacuum-curing step after contact deposition that allowed mitigating the loss in efficiency of the solar devices, as well as a full recovery of the electrical performances after device storage in dry nitrogen and dark conditions. The device durability compared to reference devices was tested over 90 days. Conductive atomic force microscopy (CAFM) disclosed an improved surface capability to hole exchange under the graphite contact after vacuum curing treatment.

scholarly journals Non-Fullerene Small Molecule Electron-Transporting Materials for Efficient p-i-n Perovskite Solar Cells

Nanomaterials ◽  
2020 ◽  
Vol 10 (6) ◽  
pp. 1082
Author(s):  
Da-Seul Choi ◽  
Sung-Nam Kwon ◽  
Seok-In Na
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Electron Transport ◽  
Perovskite Solar Cells ◽  
Internal Resistance ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Many ◽  
Low Coverage

PC61BM is commonly used in perovskite solar cells (PSC) as the electron transport material (ETM). However, PC61BM film has various disadvantages, such as its low coverage or the many pinholes that appear due to its aggregation behavior. These faults may lead to undesirable direct contact between the metal cathode and perovskite film, which could result in charge recombination at the perovskite/metal interface. In order to overcome this problem, three alternative non-fullerene electron materials were applied to inverted PSCs; they were evaluated on suitability as electron transport layers. The roles and effects of these non-fullerene ETMs on device performance were studied using photoluminescence (PL) measurements, field emission scanning electron microscopy (FE-SEM), atomic force microscopy (AFM), internal resistance in PSC measurements, and conductive atomic force microscopy (C-AFM). It was found that one of the tested materials, IT-4f, showed excellent electron extraction ability and was associated with reduced recombination. The PSC with IT-4f as the ETM produced better cell-performance; it had an average PCE of 11.21%, which makes it better than the ITIC and COi8DFIC-based devices. Finally, IT-4f was compared with PC61BM; it was found that the two materials have quite comparable efficiency and stability levels.

Emerging Conductive Atomic Force Microscopy for Metal Halide Perovskite Materials and Solar Cells

2020 ◽  
Vol 10 (10) ◽  
pp. 1903922 ◽  
Author(s):  
Haonan Si ◽  
Suicai Zhang ◽  
Shuangfei Ma ◽  
Zhaozhao Xiong ◽  
Ammarah Kausar ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Metal Halide ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Perovskite Materials ◽  
Metal Halide Perovskite ◽  
Halide Perovskite

Analysis of Microstructure of Polyamic Acid Alkylamine Salt Monolayers by Atomic Force Microscopy and Friction Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 1) ◽  
pp. 248-251 ◽  
Author(s):  
Jiro Hamaya ◽  
Nobuyuki Wakayama ◽  
Mitsutoshi Jikei ◽  
Masa-aki Kakimoto
Keyword(s):  
Atomic Force Microscopy ◽  
Friction Force ◽  
Friction Force Microscopy ◽  
Polyamic Acid ◽  
Force Microscopy ◽  
Atomic Force
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