Growth Kinetics of the Hydroxyapatite (0001) Face Revealed by Phase Shift Interferometry and Atomic Force Microscopy

1998 ◽  
Vol 102 (40) ◽  
pp. 7833-7838 ◽  
Author(s):  
Kazuo Onuma ◽  
Noriko Kanzaki ◽  
Atsuo Ito ◽  
Tetsuya Tateishi
1995 ◽  
Vol 154 (1-2) ◽  
pp. 118-125 ◽  
Author(s):  
Kazuo Onuma ◽  
Atsuo Ito ◽  
Tetsuya Tateishi ◽  
Tetsuya Kameyama

2000 ◽  
Vol 07 (05n06) ◽  
pp. 577-582 ◽  
Author(s):  
J.-F. NIELSEN ◽  
J. P. PELZ ◽  
M. S. PETTERSEN

Atomic force microscopy and optical microscopy were used to observe a novel "step bending" instability on vicinal Si(001) surfaces heated with direct current along a <110> direction. This instability occurs on areas where the applied current is parallel to the average step direction and consists of wavy step undulations with a nonzero phase shift between adjacent steps, consistent with theoretical predictions by Liu et al. [Phys. Rev. Lett.81, 2743 (1998)]. The resulting "bands" of high step density run obliquely to the direction of the applied current. These step patterns were observed on spherically dimpled surfaces, which also exhibit a variety of other electromigration-induced instabilities.


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