OBSERVATION OF DIRECT-CURRENT-INDUCED STEP BENDING PATTERNS ON Si(001)
2000 ◽
Vol 07
(05n06)
◽
pp. 577-582
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Keyword(s):
Atomic force microscopy and optical microscopy were used to observe a novel "step bending" instability on vicinal Si(001) surfaces heated with direct current along a <110> direction. This instability occurs on areas where the applied current is parallel to the average step direction and consists of wavy step undulations with a nonzero phase shift between adjacent steps, consistent with theoretical predictions by Liu et al. [Phys. Rev. Lett.81, 2743 (1998)]. The resulting "bands" of high step density run obliquely to the direction of the applied current. These step patterns were observed on spherically dimpled surfaces, which also exhibit a variety of other electromigration-induced instabilities.
Keyword(s):
2002 ◽
Vol 205
(2)
◽
pp. 136-146
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2015 ◽
Vol 20
(1)
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pp. 226-236
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Keyword(s):
1998 ◽
Vol 102
(40)
◽
pp. 7833-7838
◽
Keyword(s):
1994 ◽
Vol 112
(1)
◽
pp. 32-40
◽
Keyword(s):
2002 ◽
Vol 73
(8)
◽
pp. 2942-2947
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