High Contrast Imaging of Interphases in Ternary Polymer Blends Using Focused Ion Beam Preparation and Atomic Force Microscopy
Keyword(s):
Ion Beam
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High aspect ratio all diamond tips formed by focused ion beam for conducting atomic force microscopy
1999 ◽
Vol 17
(4)
◽
pp. 1570
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Keyword(s):
Ion Beam
◽