Tunable Plasmonic Coupling in Self-Assembled Binary Nanocrystal Superlattices Studied by Correlated Optical Microspectrophotometry and Electron Microscopy

Nano Letters ◽  
2013 ◽  
Vol 13 (3) ◽  
pp. 1291-1297 ◽  
Author(s):  
Xingchen Ye ◽  
Jun Chen ◽  
Benjamin T. Diroll ◽  
Christopher B. Murray
Keyword(s):  
Electron Microscopy ◽  
Plasmonic Coupling ◽  
Nanocrystal Superlattices ◽  
Self Assembled ◽  
Binary Nanocrystal Superlattices

Systematic Electron Crystallographic Studies of Self-Assembled Binary Nanocrystal Superlattices

ACS Nano ◽  
2010 ◽  
Vol 4 (4) ◽  
pp. 2374-2381 ◽  
Author(s):  
Jun Chen ◽  
Xingchen Ye ◽  
Christopher B. Murray
Keyword(s):  
Nanocrystal Superlattices ◽  
Self Assembled ◽  
Binary Nanocrystal Superlattices

Hierarchical Materials Design by Pattern Transfer Printing of Self-Assembled Binary Nanocrystal Superlattices

Nano Letters ◽  
2017 ◽  
Vol 17 (3) ◽  
pp. 1387-1394 ◽  
Author(s):  
Taejong Paik ◽  
Hongseok Yun ◽  
Blaise Fleury ◽  
Sung-Hoon Hong ◽  
Pil Sung Jo ◽  
...  
Keyword(s):  
Materials Design ◽  
Pattern Transfer ◽  
Transfer Printing ◽  
Hierarchical Materials ◽  
Nanocrystal Superlattices ◽  
Self Assembled ◽  
Binary Nanocrystal Superlattices

Synergism in binary nanocrystal superlattices leads to enhanced p-type conductivity in self-assembled PbTe/Ag2Te thin films

2007 ◽  
Vol 6 (2) ◽  
pp. 115-121 ◽  
Author(s):  
Jeffrey J. Urban ◽  
Dmitri V. Talapin ◽  
Elena V. Shevchenko ◽  
Cherie R. Kagan ◽  
Christopher B. Murray
Keyword(s):  
Thin Films ◽  
Type Conductivity ◽  
Nanocrystal Superlattices ◽  
Self Assembled ◽  
P Type ◽  
Binary Nanocrystal Superlattices

Self-Assembled Gold Nanoparticle/Alkanedithiol Films:  Preparation, Electron Microscopy, XPS-Analysis, Charge Transport, and Vapor-Sensing Properties†

2003 ◽  
Vol 107 (30) ◽  
pp. 7406-7413 ◽  
Author(s):  
Yvonne Joseph ◽  
Isabelle Besnard ◽  
Miriam Rosenberger ◽  
Berit Guse ◽  
Heinz-Georg Nothofer ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Charge Transport ◽  
Gold Nanoparticle ◽  
Xps Analysis ◽  
Sensing Properties ◽  
Vapor Sensing ◽  
Self Assembled

Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

1999 ◽  
Vol 5 (6) ◽  
pp. 413-419 ◽  
Author(s):  
Bernardo R.A. Neves ◽  
Michael E. Salmon ◽  
Phillip E. Russell ◽  
E. Barry Troughton
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Field Emission ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled ◽  
Scanning Electron

Abstract: In this work, we show how field emission–scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems. We have carried out a comparative study using FE-SEM and atomic force microscopy (AFM) to assess the morphology and coverage of self-assembled monolayers (SAM) on different substrates. The results show that FE-SEM images present the same qualitative information obtained by AFM images when the SAM is deposited on a smooth substrate (e.g., mica). Further experiments with rough substrates (e.g., Al grains on glass) show that FE-SEM is capable of unambiguously identifying SAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces.

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