Hydrogen-Induced Morphotropic Phase Transformation of Single-Crystalline Vanadium Dioxide Nanobeams

Nano Letters ◽  
2013 ◽  
Vol 13 (4) ◽  
pp. 1822-1828 ◽  
Author(s):  
Woong-Ki Hong ◽  
Jong Bae Park ◽  
Jongwon Yoon ◽  
Bong-Joong Kim ◽  
Jung Inn Sohn ◽  
...  
2013 ◽  
Vol 24 (34) ◽  
pp. 345701 ◽  
Author(s):  
Sung-Jin Chang ◽  
Woong-Ki Hong ◽  
Hae Jin Kim ◽  
Jin Bae Lee ◽  
Jongwon Yoon ◽  
...  

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Run Shi ◽  
Yong Chen ◽  
Xiangbin Cai ◽  
Qing Lian ◽  
Zhuoqiong Zhang ◽  
...  

AbstractA systematic study of various metal-insulator transition (MIT) associated phases of VO2, including metallic R phase and insulating phases (T, M1, M2), is required to uncover the physics of MIT and trigger their promising applications. Here, through an oxide inhibitor-assisted stoichiometry engineering, we show that all the insulating phases can be selectively stabilized in single-crystalline VO2 beams at room temperature. The stoichiometry engineering strategy also provides precise spatial control of the phase configurations in as-grown VO2 beams at the submicron-scale, introducing a fresh concept of phase transition route devices. For instance, the combination of different phase transition routes at the two sides of VO2 beams gives birth to a family of single-crystalline VO2 actuators with highly improved performance and functional diversity. This work provides a substantial understanding of the stoichiometry-temperature phase diagram and a stoichiometry engineering strategy for the effective phase management of VO2.


2006 ◽  
Vol 306-308 ◽  
pp. 601-606
Author(s):  
Seung Baek ◽  
Jae Mean Koo ◽  
Chang Sung Seok

Nano-indentation test is used widely to determine the fracture toughness of brittle materials and to provide information on important material properties such as the Young’s modulus and hardness. In this study, using nano-indentation testing, atomic force microscope (AFM), and finite element method (FEM), we performed the indentation fracture toughness and fracture strength measurement for a (100) single crystalline silicon at different load states. In addition, the loads of the phase transformation events during unloading were estimated by the load-depth curves. The phase transformation load and micro-crack propagation events at pop-out during the unloading process depended on the maximum applied indentation load.


2019 ◽  
Vol 29 (20) ◽  
pp. 1970138
Author(s):  
Run Shi ◽  
Xiangbin Cai ◽  
Weijun Wang ◽  
Jingwei Wang ◽  
Dejun Kong ◽  
...  

Micron ◽  
2019 ◽  
Vol 119 ◽  
pp. 1-7 ◽  
Author(s):  
A. Pukenas ◽  
P. Chekhonin ◽  
M. Meißner ◽  
E. Hieckmann ◽  
S. Aswartham ◽  
...  

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