scholarly journals Giant renormalization of dopant impurity levels in 2D semiconductor MoS2

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Jeongwoon Hwang ◽  
Chenxi Zhang ◽  
Yong-Sung Kim ◽  
Robert M. Wallace ◽  
Kyeongjae Cho
Keyword(s):  
2001 ◽  
Vol 48 (12) ◽  
pp. 2945-2947 ◽  
Author(s):  
Guoxin Li ◽  
A. Neugroschel ◽  
Chih-Tang Sah ◽  
D. Hemmenway ◽  
T. Rivoli ◽  
...  

1998 ◽  
Vol 72 (23) ◽  
pp. 3011-3013 ◽  
Author(s):  
Francesco Priolo ◽  
Giovanni Mannino ◽  
Monica Miccichè ◽  
Vittorio Privitera ◽  
Enrico Napolitani ◽  
...  

1996 ◽  
Vol 43 (1) ◽  
pp. 15-20 ◽  
Author(s):  
P.K. Basu ◽  
B.C. Chakravarty ◽  
S.N. Singh ◽  
P. Dutta ◽  
R. Kesavan

2014 ◽  
Vol 2014 ◽  
pp. 1-15 ◽  
Author(s):  
Judith G. Reynolds ◽  
C. Lewis Reynolds

This paper reviews the recent progress in acceptor doping of ZnO that has been achieved with a focus toward the optimum strategy. There are three main approaches for generating p-type ZnO: substitutional group IA elements on a zinc site, codoping of donors and acceptors, and substitution of group VA elements on an oxygen site. The relevant issues are whether there is sufficient incorporation of the appropriate dopant impurity species, does it reside on the appropriate lattice site, and lastly whether the acceptor ionization energy is sufficiently small to enable significant p-type conduction at room temperature. The potential of nitrogen doping and formation of the appropriate acceptor complexes is highlighted although theoretical calculations predict that nitrogen on an oxygen site is a deep acceptor. We show that an understanding of the growth and annealing steps to achieve the relevant acceptor defect complexes is crucial to meet requirements.


1992 ◽  
Vol 261 ◽  
Author(s):  
A. G. U. Perera ◽  
R. E. Sherriff ◽  
M. H. Francombe ◽  
R. P. Devaty

ABSTRACTA cryogenic extrinsic silicon detector which can detect IR photons of very low energy, i.e., down to about 5.5 meV ( 220 μm) is presented. The mechanism involves photoexcitation of carriers over low energy interfacial work function barriers at p-i or n-i interfaces in a process analogous to the classic photoelectric effect. Estimates for the responsivity and the detectivity for unoptimized commercial samples containing both p-i and n-i interfaces and a sample containing only a single p-i interface are provided by comparison with a silicon composite bolometer. The range of long wavelength thresholds (λt) observed suggests that this approach can be used to tailor detectors for different IR wavelength regions by changing the dopant impurity and the impurity concentration at levels near the metal-insulator transition. Single interface results confirm the possibility of detector optimization using multilayered structures. This should lead to a unique family of uniform monolithic IR focal plane structures with tailorable and tunable response characteristics within virtually all the IR spectral range of interest.


2014 ◽  
Vol 61 (2) ◽  
pp. 386-393 ◽  
Author(s):  
Nima Dehdashti Akhavan ◽  
Gregory Jolley ◽  
Gilberto Antonio Umana-Membreno ◽  
Jarek Antoszewski ◽  
Lorenzo Faraone

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