scholarly journals The electronic properties of SrTiO3-δ with oxygen vacancies or substitutions

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
L. L. Rusevich ◽  
M. Tyunina ◽  
E. A. Kotomin ◽  
N. Nepomniashchaia ◽  
A. Dejneka

AbstractThe electronic properties, including bandgap and conductivity, are critical for nearly all applications of multifunctional perovskite oxide ferroelectrics. Here we analysed possibility to induce semiconductor behaviour in these materials, which are basically insulators, by replacement of several percent of oxygen atoms with nitrogen, hydrogen, or vacancies. We explored this approach for one of the best studied members of the large family of ABO3 perovskite ferroelectrics — strontium titanate (SrTiO3). The atomic and electronic structure of defects were theoretically investigated using the large-scale first-principles calculations for both bulk crystal and thin films. The results of calculations were experimentally verified by studies of the optical properties at photon energies from 25 meV to 8.8 eV for in-situ prepared thin films. It was demonstrated that substitutions and vacancies prefer locations at surfaces or phase boundaries over those inside crystallites. At the same time, local states in the bandgap can be produced by vacancies located both inside the crystals and at the surface, but by nitrogen substitution only inside crystals. Wide-bandgap insulator phases were evidenced for all defects. Compared to pure SrTiO3 films, bandgap widening due to defects was theoretically predicted and experimentally detected.

1986 ◽  
Vol 82 ◽  
Author(s):  
J. C. Bilello

ABSTRACTThe application of relatively low resolution x-ray topography methods, typically ∿ 1 micrometer, is limited in studies which involve large scale dislocation networks. However, the ability to non-destructively image wide areas for “thick” specimens at high intensity with a tunable x-ray source makes the synchrotron an ideal probe for a range of problems previously inaccessible by other methods. Some examples will be discussed such as: (a) crack initiation and propagation in fatigued bicrystals, (b) real-time in situ plastic deformation studies in strain-annealed Mo crystals, and (c) strain distributions in vapor deposited and LPE thin films on Si and GaAs substrates.


2007 ◽  
Vol 546-549 ◽  
pp. 2027-2030 ◽  
Author(s):  
Yue Zhao ◽  
Yi Sun Wu ◽  
S.X. Dou ◽  
T. Tajima ◽  
O.S. Romanenko

MgB2 thin films have been coated on Nb substrates without any buffer layers. An in situ pulsed laser deposition (PLD) method was used to prepare the coating. The interface between films and substrates has been characterized by scanning electron microscopy (SEM). Surface impedance has been measured for the MgB2 films on Nb substrates. The results were discussed with regard to the potential large scale applications in superconducting RF cavities.


Author(s):  
J. V. Maskowitz ◽  
W. E. Rhoden ◽  
D. R. Kitchen ◽  
R. E. Omlor ◽  
P. F. Lloyd

The existence of electromigration in thin films has been acknowledged since the early sixties. Electromigration is described as the main transport for atoms in a conductor under a current stress. Initial interest had been of a theoretical nature as electromigration had little impact on circuit reliability. With the maturing of Very Large Scale Integrated Circuit (VLSI) technology, current densities are exceeding 106 Amps/cm2 while linestripes are reaching into the submicron range. In this environment, electromigration can cause unwanted open or short circuits in thin films. This has serious implications on the reliability of any integrated circuit. By 1990, millions of transistors may be fabricated on a chip with feature sizes smaller than the wavelength of visible light.


RSC Advances ◽  
2017 ◽  
Vol 7 (47) ◽  
pp. 29496-29504 ◽  
Author(s):  
Zhuohan Ding ◽  
Yuanyuan Cui ◽  
Dongyun Wan ◽  
Hongjie Luo ◽  
Yanfeng Gao

We present an effective strategy to modify the electronic properties of VO2(B) by inducing elastic strain with TiO2(A) buffer layer.


1992 ◽  
Vol 271 ◽  
Author(s):  
William S. Rees ◽  
Yusuf S. Hascicek ◽  
Louis R. Testardi

ABSTRACTFilms of YBa2CU3O7-δ have been grown on 1” LaAlO3 by OMVPE utilizing M(tmhd)n (M = Ba, Cu: n = 2; M = Y: n = 3; tmhd = 2,2,6,6-tetramethylheptane-3,5-dionato) as the source materials in a cold wall, vertical rotating disk reactor. The resultant films were characterized by SEM, XRD, Tc, Jc, and surface profilometry measurements. Relative to laser ablated thin films, the surface morphology was determined to be virtually featureless. In-situ depositions at substrate temperatures of <700°C, employing nitrous oxide as the oxidizing reagent, produced annular irregularities in the electronic properties of these films. The highest quality was observed near the film's center, with a marked decay evident toward the exterior 7 mm perimeter of the coated wafer.


Author(s):  
Enesio Marinho Jr ◽  
Pedro Alves da Silva Autreto

Graphene-based materials (GBMs) are a large family of materials that have attracted great interest due to potential applications. In this work, we applied first-principles calculations based on density functional theory...


2018 ◽  
Vol 6 (25) ◽  
pp. 6680-6690 ◽  
Author(s):  
Jianli Cheng ◽  
Kesong Yang

This work demonstrates an efficient approach to design perovskite-oxide-based two dimensional electron gas systems using large-scale first-principles calculations.


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