In situ observations of silver bromide tabular crystal growth

1998 ◽  
Vol 94 (15) ◽  
pp. 2195-2198 ◽  
Author(s):  
A. Millan ◽  
P. Bennema ◽  
A. Verbeeck ◽  
D. Bollen

2007 ◽  
Vol 307 (2) ◽  
pp. 341-347 ◽  
Author(s):  
Xinming Huang ◽  
Satoshi Uda ◽  
Hideyoshi Tanabe ◽  
Nobuyuki Kitahara ◽  
Hisao Arimune ◽  
...  


2002 ◽  
Vol 243 (2) ◽  
pp. 275-282 ◽  
Author(s):  
Kozo Fujiwara ◽  
Keiji Nakajima ◽  
Toru Ujihara ◽  
Noritaka Usami ◽  
Gen Sazaki ◽  
...  


1991 ◽  
Vol 190 (1-2) ◽  
pp. 14-17 ◽  
Author(s):  
Hiroshi Komatsu ◽  
Yuki Kato ◽  
Satoru Miyashita ◽  
Tetsuo Inoue ◽  
Shigeyuki Hayashi


Author(s):  
Aniket R. Inamdar ◽  
Sanjiva K. Lele ◽  
Mark Z. Jacobson

This study uses a Fickian-Distribution parameterization [Chen & Lamb, 1994] to model the effects of ice habits on contrail formation within a large eddy simulation (LES). Box model cases were first performed at various ambient temperatures and relative humidities over ice (RHi) and results compared with available laboratory data of ice crystal growth and habit distribution [Bailey & Hallett, 2004]. The model was then used in a full 3-D LES of contrails and results were compared with in-situ observations [Febvre et. al., 2009]. Comparisons are also made with results from simulations that used a probabilistic ice habit model [Inamdar et. al., 2013].





Author(s):  
T. Marieb ◽  
J. C. Bravman ◽  
P. Flinn ◽  
D. Gardner ◽  
M. Madden

Electromigration and stress voiding have been active areas of research in the microelectronics industry for many years. While accelerated testing of these phenomena has been performed for the last 25 years[1-2], only recently has the introduction of high voltage scanning electron microscopy (HVSEM) made possible in situ testing of realistic, passivated, full thickness samples at high resolution.With a combination of in situ HVSEM and post-testing transmission electron microscopy (TEM) , electromigration void nucleation sites in both normal polycrystalline and near-bamboo pure Al were investigated. The effect of the microstructure of the lines on the void motion was also studied.The HVSEM used was a slightly modified JEOL 1200 EX II scanning TEM with a backscatter electron detector placed above the sample[3]. To observe electromigration in situ the sample was heated and the line had current supplied to it to accelerate the voiding process. After testing lines were prepared for TEM by employing the plan-view wedge technique [6].





2020 ◽  
Author(s):  
Keishiro Yamashita ◽  
Kazuki Komatsu ◽  
Hiroyuki Kagi

An crystal-growth technique for single crystal x-ray structure analysis of high-pressure forms of hydrogen-bonded crystals is proposed. We used alcohol mixture (methanol: ethanol = 4:1 in volumetric ratio), which is a widely used pressure transmitting medium, inhibiting the nucleation and growth of unwanted crystals. In this paper, two kinds of single crystals which have not been obtained using a conventional experimental technique were obtained using this technique: ice VI at 1.99 GPa and MgCl<sub>2</sub>·7H<sub>2</sub>O at 2.50 GPa at room temperature. Here we first report the crystal structure of MgCl2·7H2O. This technique simultaneously meets the requirement of hydrostaticity for high-pressure experiments and has feasibility for further in-situ measurements.



2020 ◽  
Vol 20 (10) ◽  
pp. 6604-6609
Author(s):  
Shanshan Liu ◽  
Guochun Zhang ◽  
Kai Feng ◽  
Yanyang Han ◽  
Tao He ◽  
...  


Author(s):  
Tetsuhiko Miyadera ◽  
Yuto Auchi ◽  
Kohei Yamamoto ◽  
Noboru Ohashi ◽  
Tomoyuki Koganezawa ◽  
...  


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