Structural changes in surface and bulk LiNi0.5Mn0.5O2 during electrochemical reaction on epitaxial thin-film electrodes characterized by in situ X-ray scattering

2010 ◽  
Vol 12 (15) ◽  
pp. 3815 ◽  
Author(s):  
Kazuyuki Sakamoto ◽  
Masaaki Hirayama ◽  
Hiroaki Konishi ◽  
Noriyuki Sonoyama ◽  
Nicolas Dupré ◽  
...  
Keyword(s):  
Thin Film ◽  
Structural Changes ◽  
Electrochemical Reaction ◽  
Epitaxial Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Thin Film Electrodes ◽  
Ray Scattering

scholarly journals Indentation-Induced Structural Changes in Vitreous Silica Probed by in-situ Small-Angle X-Ray Scattering

2020 ◽  
Vol 7 ◽  
Author(s):  
Sindy Fuhrmann ◽  
Guilherme N. B. M. de Macedo ◽  
René Limbach ◽  
Christina Krywka ◽  
Sebastian Bruns ◽  
...  
Keyword(s):  
Small Angle ◽  
Structural Changes ◽  
Vitreous Silica ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Study of the structural evolution in ZnO thin film by in situ synchrotron x-ray scattering

2004 ◽  
Vol 96 (3) ◽  
pp. 1740-1742 ◽  
Author(s):  
Tae-Bong Hur ◽  
Yoon-Hwae Hwang ◽  
Hyung-Kook Kim ◽  
Hong-Lee Park
Keyword(s):  
Thin Film ◽  
Structural Evolution ◽  
Zno Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

In Situ X-Ray Scattering Studies of Poly(ε -caprolactone) Networks with Grafted Poly(ethylene glycol) Chains to Investigate Structural Changes during Dual- and Triple-Shape Effect

2010 ◽  
Vol 31 (17) ◽  
pp. 1546-1553 ◽  
Author(s):  
Wolfgang Wagermaier ◽  
Thomas Zander ◽  
Dieter Hofmann ◽  
Karl Kratz ◽  
U. Narendra Kumar ◽  
...  
Keyword(s):  
Ethylene Glycol ◽  
Structural Changes ◽  
Shape Effect ◽  
Poly Ethylene Glycol ◽  
X Ray ◽  
X Ray Scattering ◽  
Poly Ethylene ◽  
Ray Scattering

In situ low-angle x-ray scattering study of phase separation in initially mixed HfO2–SiO2 thin film interfaces

2004 ◽  
Vol 85 (24) ◽  
pp. 5884-5886 ◽  
Author(s):  
Jeong-Hee Ha ◽  
David Chi ◽  
Paul C. McIntyre
Keyword(s):  
Thin Film ◽  
Phase Separation ◽  
X Ray ◽  
Sio2 Thin Film ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

scholarly journals In-Situ Coupling Applied Voltage and Synchrotron Radiation: Operando Characterization of Transistors

2021 ◽  
Author(s):  
Anton Davydok ◽  
Yuriy N. Luponosov ◽  
Sergey A. Ponomarenko ◽  
Souren Grigorian
Keyword(s):  
Applied Voltage ◽  
Structural Changes ◽  
Field Effect Transistors ◽  
Small Dimension ◽  
Electrical Stability ◽  
X Ray ◽  
X Ray Scattering ◽  
Synchrotron Beamlines ◽  
Ray Scattering

Abstract A compact voltage application setup has been developed for in-situ electrical testing of organic field effect transistors in combination with X-ray scattering studies at a synchrotron beamlines. Challenges faced during real condition in-operando test of newly developed OFETs originated an idea of creation of a new setup which excludes number of factors that make experiments complicated. The application of the setup is demonstrated on a prototype of an organic transistors based on α,ω-dihexyl-α-quaterthiophene molecules. The new setup allows to monitor material structural changes by X-ray scattering under applied voltage conditions and their direct correlations. The versatile setup eliminates possible shadowing effects and short circuits due to misalignment of the contacts. The electrical stability of the prototypes was characterized by the application of different voltage values. Corresponding structural changes were monitored by grazing X-ray scattering technique before, during and after the voltage was applied. The selected oligothiophene material with proved transistor properties shows high stability and directional anisotropy under applied voltage conditions. Thanks to a compact and flexible design of the setup different type of small dimension devices could be studied under external voltage conditions at various synchrotron beamlines.

A Revised O2 Reduction Model in Li-O2 Batteries as Revealed by in Situ Small Angle X-Ray Scattering

2019 ◽  
Author(s):  
Christian Prehal ◽  
Aleksej Samojlov ◽  
Manfred Nachtnebel ◽  
Manfred Kriechbaum ◽  
Heinz Amenitsch ◽  
...  
Keyword(s):  
Small Angle ◽  
Wide Angle ◽  
Reduction Mechanism ◽  
Reduction Model ◽  
X Ray ◽  
X Ray Scattering ◽  
O2 Reduction ◽  
Ray Scattering

<b>Here we use in situ small and wide angle X-ray scattering to elucidate unexpected mechanistic insights of the O2 reduction mechanism in Li-O2 batteries.<br></b>

In situ Time-Resolved Small-Angle X-ray Scattering Reveals the Formation Kinetics of Polyelectrolyte Complex Micelles

2019 ◽  
Author(s):  
Hao Wu ◽  
Jeffrey Ting ◽  
Siqi Meng ◽  
Matthew Tirrell
Keyword(s):  
Small Angle ◽  
Self Assembly ◽  
Electrostatic Interactions ◽  
Polyelectrolyte Complex ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Kinetics Of ◽  
Ray Scattering

We have directly observed the <i>in situ</i> self-assembly kinetics of polyelectrolyte complex (PEC) micelles by synchrotron time-resolved small-angle X-ray scattering, equipped with a stopped-flow device that provides millisecond temporal resolution. This work has elucidated one general kinetic pathway for the process of PEC micelle formation, which provides useful physical insights for increasing our fundamental understanding of complexation and self-assembly dynamics driven by electrostatic interactions that occur on ultrafast timescales.

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