Combined in situ atomic force microscopy and infrared attenuated total reflection spectroelectrochemistry

The Analyst ◽  
2013 ◽  
Vol 138 (22) ◽  
pp. 6746 ◽  
Author(s):  
Daniel Neubauer ◽  
Jochen Scharpf ◽  
Alberto Pasquarelli ◽  
Boris Mizaikoff ◽  
Christine Kranz
Keyword(s):  
Atomic Force Microscopy ◽  
Total Reflection ◽  
Attenuated Total Reflection ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force

Use of in-situ atomic force microscopy to monitor the biodegradation of polyhydroxyalkanoates (PHAs)

2001 ◽  
Vol 167 (1) ◽  
pp. 139-151 ◽  
Author(s):  
Connie J. Rossini ◽  
Justinn F. Arceo ◽  
Evan R. McCarney ◽  
Brian H. Augustine ◽  
Douglas E. Dennis ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force
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