Electronic transport properties of transition metal dichalcogenide field-effect devices: surface and interface effects

2015 ◽  
Vol 44 (21) ◽  
pp. 7715-7736 ◽  
Author(s):  
Hennrik Schmidt ◽  
Francesco Giustiniano ◽  
Goki Eda

We review the state-of-the-art electronic properties of atomically thin TMD FETs with a focus on surface and interface effects.

2016 ◽  
Vol 4 (46) ◽  
pp. 10962-10966 ◽  
Author(s):  
Yipeng An ◽  
Mengjun Zhang ◽  
Dapeng Wu ◽  
Zhaoming Fu ◽  
Kun Wang

All kinds of MoS2–WS2 lateral heterojunctions present an interesting negative differential resistive effect.


2019 ◽  
Vol 5 (12) ◽  
pp. 1900730 ◽  
Author(s):  
Sanghyuck Yu ◽  
Yongjae Cho ◽  
June Yeong Lim ◽  
Hyeokjae Kwon ◽  
Yeonsu Jeong ◽  
...  

2019 ◽  
Vol 21 (21) ◽  
pp. 11359-11366 ◽  
Author(s):  
Armando Pezo ◽  
Matheus P. Lima ◽  
Marcio Costa ◽  
Adalberto Fazzio

Transition metal dichalcogenides (TMDCs) are promising materials for applications in nanoelectronics and correlated fields, where their metallic edge states play a fundamental role in the electronic transport.


Nanoscale ◽  
2020 ◽  
Vol 12 (16) ◽  
pp. 8883-8889 ◽  
Author(s):  
Ronen Dagan ◽  
Yonatan Vaknin ◽  
Yossi Rosenwaks

Gap states and Fermi level pinning play an important role in all semiconductor devices, but even more in transition metal dichalcogenide-based devices due to their high surface to volume ratio and the absence of intralayer dangling bonds.


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