scholarly journals The role of oxygen vacancies in the high cycling endurance and quantum conductance in BiVO 4 ‐based resistive switching memory

InfoMat ◽  
2020 ◽  
Vol 2 (5) ◽  
pp. 960-967 ◽  
Author(s):  
Mengting Zhao ◽  
Xiaobing Yan ◽  
Long Ren ◽  
Mengliu Zhao ◽  
Fei Guo ◽  
...  

2019 ◽  
Vol 5 (5) ◽  
pp. 1800833 ◽  
Author(s):  
Rulin Zhang ◽  
Hong Huang ◽  
Qing Xia ◽  
Cong Ye ◽  
Xiaodi Wei ◽  
...  


2016 ◽  
Vol 689 ◽  
pp. 800-804 ◽  
Author(s):  
Shuxia Ren ◽  
Jiajun Guo ◽  
Li Zhang ◽  
Xu Zhao ◽  
Wei Chen


2018 ◽  
Vol 10 (25) ◽  
pp. 21445-21450 ◽  
Author(s):  
Tae Hyung Park ◽  
Young Jae Kwon ◽  
Hae Jin Kim ◽  
Hyo Cheon Woo ◽  
Gil Seop Kim ◽  
...  




2017 ◽  
Vol 5 (25) ◽  
pp. 6319-6327 ◽  
Author(s):  
Teng-Yu Su ◽  
Chi-Hsin Huang ◽  
Yu-Chuan Shih ◽  
Tsang-Hsuan Wang ◽  
Henry Medina ◽  
...  

The role of defect engineering is essential in resistive switching memory.



2009 ◽  
Vol 190 ◽  
pp. 012074 ◽  
Author(s):  
B P Andreasson ◽  
M Janousch ◽  
U Staub ◽  
G I Meijer ◽  
A Ramar ◽  
...  


RSC Advances ◽  
2016 ◽  
Vol 6 (26) ◽  
pp. 21736-21741 ◽  
Author(s):  
Kyuhyun Park ◽  
Jang-Sik Lee

Reliable resistive switching memory devices were developed by controlling the oxygen vacancies in aluminum oxide layer during atomic layer deposition and by adopting bilayer structures.



RSC Advances ◽  
2016 ◽  
Vol 6 (59) ◽  
pp. 54113-54118 ◽  
Author(s):  
Pengfei Hou ◽  
Jinbin Wang ◽  
Xiangli Zhong ◽  
Yuexian Wu

Ferroelectric resistive switching memory is a non-destructive and easy to achieve multilevel storage, which is a breakthrough for further improving the density in the random access memory.



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