Atomic-scale friction on diamond(111) studied by ultra-high vacuum atomic force microscopy

A new self-excited micro-oscillator is proposed as a velocity reference that could aid the dissemination of nanonewton-level forces that are traceable to the International System of Units (SI). An analog control system is developed to keep the actuation side of the device oscillating sinusoidally with an amplitude that is fairly insensitive to the quality factor. Consequently, the device can be calibrated as a velocity reference in air and used in ultra-high vacuum with a velocity shift of less than one percent. Hence, the calibrated micro-oscillator could be used with electrostatic forces to calibrate cantilevers used for atomic force microscopy (AFM) as SI-traceable force transducers. Furthermore, the calibrated micro-oscillator could potentially be used as an AFM sensor to achieve atomic resolutions on par with those realized in frequency-modulation AFM (FM-AFM) with quartz tuning forks.

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Atomic-Force Microscopy with piezoresistive cantilevers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100173054 ◽

1994 ◽

Vol 52 ◽

pp. 1064-1065

Author(s):

M. Tortonese ◽

F. J. Giessibl

Keyword(s):

Atomic Force Microscopy ◽

Electron Tunneling ◽

High Vacuum ◽

Ultra High Vacuum ◽

Cantilever Deflection ◽

Force Microscopy ◽

Large Samples ◽

Atomic Force ◽

High Lateral Resolution ◽

Piezoresistive Cantilevers

The atomic force microscope (AFM) works by measuring the deflection of a cantilever as it is scanned over a sample. A sharp tip at the end of the cantilever is responsible for the high lateral resolution achieved with the AFM. There are several ways to measure the deflection of the cantilever. The technique used to measure the deflection of the cantilever most often dictates the mechanical complexity and stability of the instrument. Electron tunneling, interferometry and capacitive sensors have been used successfully. The most common way to measure the cantilever deflection is by means of an optical deflection detector.The piezoresistivc cantilever offers a new way to measure the deflection of the cantilever, with performances comparable to the performances of other deflection detectors, and with the advantage that the sensor is incorporated in the cantilever. This simplifies the design and operation of the microscope In particular, the piezoresistive cantilever facilitates the use and often improves the performances of an AFM when operated in ultra high vacuum (UHV), at low temperature, or when used to image large samples.

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Linear measurements of nanomechanical phenomena using small-amplitude AFM

MRS Proceedings ◽

10.1557/proc-838-o1.8 ◽

2004 ◽

Vol 838 ◽

Author(s):

Peter M. Hoffmann ◽

Shivprasad Patil ◽

George Matei ◽

Atay Tanulku ◽

Ralph Grimble ◽

...

Keyword(s):

High Vacuum ◽

Data Interpretation ◽

Ultra High Vacuum ◽

Atomic Scale ◽

Single Atom ◽

Linear Measurements ◽

Interaction Range ◽

Force Microscopy ◽

Atomic Force ◽

Molecular Ordering

ABSTRACTDynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water.

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Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe

Beilstein Journal of Nanotechnology ◽

10.3762/bjnano.3.3 ◽

2012 ◽

Vol 3 ◽

pp. 25-32 ◽

Cited By ~ 20

Author(s):

Adam Sweetman ◽

Sam Jarvis ◽

Rosanna Danza ◽

Philip Moriarty

Keyword(s):

Atomic Force Microscopy ◽

High Vacuum ◽

Ultra High Vacuum ◽

Dissipated Energy ◽

Tunnel Current ◽

Force Microscopy ◽

Atomic Force ◽

Wide Range ◽

Characteristic Imaging

Background: Noncontact atomic force microscopy (NC-AFM) now regularly produces atomic-resolution images on a wide range of surfaces, and has demonstrated the capability for atomic manipulation solely using chemical forces. Nonetheless, the role of the tip apex in both imaging and manipulation remains poorly understood and is an active area of research both experimentally and theoretically. Recent work employing specially functionalised tips has provided additional impetus to elucidating the role of the tip apex in the observed contrast. Results: We present an analysis of the influence of the tip apex during imaging of the Si(100) substrate in ultra-high vacuum (UHV) at 5 K using a qPlus sensor for noncontact atomic force microscopy (NC-AFM). Data demonstrating stable imaging with a range of tip apexes, each with a characteristic imaging signature, have been acquired. By imaging at close to zero applied bias we eliminate the influence of tunnel current on the force between tip and surface, and also the tunnel-current-induced excitation of silicon dimers, which is a key issue in scanning probe studies of Si(100). Conclusion: A wide range of novel imaging mechanisms are demonstrated on the Si(100) surface, which can only be explained by variations in the precise structural configuration at the apex of the tip. Such images provide a valuable resource for theoreticians working on the development of realistic tip structures for NC-AFM simulations. Force spectroscopy measurements show that the tip termination critically affects both the short-range force and dissipated energy.

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Nonlinear Multi-Mode Dynamics of a Microbeam for Noncontact Atomic Force Microscopy in Ultra-High Vacuum

Volume 1: 20th Biennial Conference on Mechanical Vibration and Noise, Parts A, B, and C ◽

10.1115/detc2005-85742 ◽

2005 ◽

Cited By ~ 1

Author(s):

W. Wu ◽

S. Pragai ◽

O. Gottlieb

Keyword(s):

Atomic Force Microscopy ◽

High Vacuum ◽

Closed Form Solution ◽

Form Solution ◽

Ultra High Vacuum ◽

Atomic Interaction ◽

Internal Resonances ◽

Force Microscopy ◽

Atomic Force ◽

Multi Mode

We study the nonlinear multi-mode dynamics of a microbeam for noncontact atomic force microscopy in ultra-high vacuum. A boundary-value problem that includes a coupled linear thermo- and viscoelastic field with a localized nonlinear atomic interaction force, augmented by the linearized heat equation, is reduced to a modal dynamical system via Galerkin’s method. An equivalent linear thermoelastic quality factor is obtained and compared with a closed form solution. A numerically obtained escape curve defines valid operating parameters for low damping conditions. Primary, secondary and coupled internal resonances of a three-mode system are examined to reveal a rich bifurcation structure.

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Ultra-High-Vacuum Atomic Force Microscopy in the Study of Model Catalysts

Forces in Scanning Probe Methods ◽

10.1007/978-94-011-0049-6_50 ◽

1995 ◽

pp. 531-536

Author(s):

A. Partridge ◽

S. L. G. Toussaint ◽

C. F. J. Flipse ◽

E. W. Kuipers

Keyword(s):

Atomic Force Microscopy ◽

High Vacuum ◽

Model Catalysts ◽

Ultra High Vacuum ◽

Force Microscopy ◽

Atomic Force

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Near Contact Mode AFM: Overcoming Surface Fluid Layer In Air And Achieve Ultra-High Resolution

Microscopy Today ◽

10.1017/s1551929500069170 ◽

1998 ◽

Vol 6 (8) ◽

pp. 12-15

Author(s):

Huddee J. Ho

Keyword(s):

Surface Defects ◽

Fluid Layer ◽

High Vacuum ◽

Ultra High Vacuum ◽

Atomic Scale ◽

Major Goal ◽

Contact Mode ◽

Force Microscopy ◽

Atomic Force ◽

Scale Surface

A major goal of Atomic Force Microscopy (AFM) is to achieve nanometer resolution on surface topography, Vibrating cantilever mode (VCM) is an important configuration of an AFU instrument, It was proposed in the first AFM paper.VCM in ultra-high vacuum (UHV) results in true AFM atomic resolution, which reveals atomic scale surface defects such as a single missing atom in a lattice. However, the VCM operation in air has many difficulties due to the surface contamination on the sample and the AFM tip. The most popular operation modes of the VCM are the non-contact mode and the Tapping mode. Both of these have limited lateral resolution in air.

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Elucidating the charge state of an Au nanocluster on the oxidized/reduced rutile TiO2 (110) surface using non-contact atomic force microscopy and Kelvin probe force microscopy

Nanoscale Advances ◽

10.1039/c9na00776h ◽

2020 ◽

Vol 2 (6) ◽

pp. 2371-2375 ◽

Cited By ~ 2

Author(s):

Yuuki Adachi ◽

Huan Fei Wen ◽

Quanzhen Zhang ◽

Masato Miyazaki ◽

Yasuhiro Sugawara ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Charge State ◽

High Vacuum ◽

Kelvin Probe Force Microscopy ◽

Ultra High Vacuum ◽

Kelvin Probe ◽

Au Nanoclusters ◽

Rutile Tio2 ◽

Force Microscopy ◽

Atomic Force

The charge state of Au nanoclusters on oxidized/reduced rutile TiO2 (110) surfaces were investigated by a combination of non-contact atomic force microscopy and Kelvin probe force microscopy at 78 K under ultra-high vacuum.

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