A controllable and efficient method for the fabrication of a single HfC nanowire field-emission point electron source aided by low keV FIB milling
Keyword(s):
Ion Beam
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A high-performance single hafnium carbide (HfC) nanowire field-induced electron emitter, sharpened with focused ion beam (FIB), is characterized by electron microscopy, atom probe tomography, and field-emission measurement.
2018 ◽
Vol 12
(1)
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pp. 87-93
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2016 ◽
Vol 23
(2)
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pp. 321-328
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2015 ◽
Vol 21
(3)
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pp. 557-563
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2013 ◽
Vol 19
(S2)
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pp. 974-975
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