An absorption spectrophotometer compatible paper-based thin-layer cuvette with an integrated pneumatic pump

2021 ◽  
Author(s):  
Kotaro Morita ◽  
Honomi Koiso ◽  
Reina Kudo ◽  
Naoki Hirayama
Keyword(s):  
Thin Layer ◽  
Absorption Spectroscopy ◽  
Aqueous Sample ◽  
Pneumatic Pump

This study presents a paper-based thin-layer optical cuvette for absorption spectroscopy with a pneumatically driven pump for the introduction of an aqueous sample. The three major components, including a sample...

PREPARATION, THIN LAYER CHROMATOGRAPHY, AND ULTRAVIOLET SPECTRA OF SOME O-BENZYL DERIVATIVES OF D-GLUCOSE

1963 ◽  
Vol 41 (7) ◽  
pp. 1801-1806 ◽  
Author(s):  
M. E. Tate ◽  
C. T. Bishop
Keyword(s):  
Thin Layer ◽  
Thin Layer Chromatography ◽  
Absorption Spectroscopy ◽  
Preparative Method ◽  
New Method ◽  
Hydroxyl Groups ◽  
Good Criterion ◽  
Ultraviolet Absorption Spectroscopy ◽  
Layer Chromatography ◽  
Derivatives Of

A new method for benzylation of carbohydrates has been developed which facilitated complete substitution of hydroxyl groups in one of the compounds prepared. Thin layer chromatography provides a good criterion of purity and is also a preparative method for separation of identifiable amounts of O-benzyl derivatives of carbohydrates. The number of benzyl groups in a compound can be determined by ultraviolet absorption spectroscopy. The following compounds were prepared, some of which have not been reported previously: benzyl-2,3,4,6-tetra-O-benzyl-α-D-glucoside; benzyl 2,3,4,6-tetra-O-benzyl-β-D-glucoside; methyl 2,3,4,6-tetra-O-benzyl-α-D-glucoside; 2,3,4,6-tetra-O-benzyl-α-D-glucose; l-O-(p-nitro-benzoyl)-2,3,4,6-tetra-O-benzyl-α-D-glucose; octa-O-benzyl sucrose; 3,5-di-O-benzyl-1,2-O-cyclohexylidene-α-D-xylose.

scholarly journals FOTOREDUKSI Cd (II) MENGGUNAKAN KATALIS TiO2 DENGAN SENSITIZER KLOROFIL YANG DIAKTIVASI SINAR MATAHARI

Molekul ◽  
2007 ◽  
Vol 2 (1) ◽  
pp. 17
Author(s):  
Uyi Sulaeman ◽  
Kapti Riyani ◽  
Anung Riapanitra ◽  
Dyah Indriastuti
Keyword(s):  
Titanium Dioxide ◽  
Thin Layer ◽  
Atomic Absorption ◽  
Absorption Spectroscopy ◽  
Atomic Absorption Spectroscopy ◽  
Sol Gel ◽  
Glass Slide ◽  
Gel Method ◽  
Sol Gel Method ◽  
Tio2 Catalyst

The photoreduction of Cd (II) has been investigated using thin layer catalyst of titanium dioxide and chlorophyll as sensitizer. Thin layer catalyst could be prepared by sol gel method deposited on glass slide. The treatments of experimental are: TiO2 catalyst using chlorophyll without sunlight illumination, TiO2 catalyst using chlorophyll with sunlight illumination and TiO2 catalyst with sunlight illumination. The concentration of Cd (II) in the solution is monitored every 30 minutes until 150 minutes illuminations by atomic absorption spectroscopy. The results showed that concentration of Cd (II) decreased reached to 45,53 % in TiO2 catalyst using chlorophyll with sunlight illumination at pH 5 after 150 minutes illumination and it decreased reached to 34.07% at pH 7 after 120 minutes illumination. Addition the chlorophyll to TiO2 catalyst increased photoreduction activities.

Applications of Photoelectron Microscopy

1976 ◽  
Vol 34 ◽  
pp. 506-507
Author(s):  
William J. Baxter
Keyword(s):  
Electron Microscopy ◽  
Thermal Decomposition ◽  
Chemical Composition ◽  
Ultraviolet Radiation ◽  
Thin Layer ◽  
Edge Effects ◽  
Electron Optics ◽  
Surface Layers ◽  
Crystalline Orientation ◽  
Fluorescent Screen

In this form of electron microscopy, photoelectrons emitted from a metal by ultraviolet radiation are accelerated and imaged onto a fluorescent screen by conventional electron optics. image contrast is determined by spatial variations in the intensity of the photoemission. The dominant source of contrast is due to changes in the photoelectric work function, between surfaces of different crystalline orientation, or different chemical composition. Topographical variations produce a relatively weak contrast due to shadowing and edge effects.Since the photoelectrons originate from the surface layers (e.g. ∼5-10 nm for metals), photoelectron microscopy is surface sensitive. Thus to see the microstructure of a metal the thin layer (∼3 nm) of surface oxide must be removed, either by ion bombardment or by thermal decomposition in the vacuum of the microscope.

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