Less expensive test pattern generation technique

IEE Proceedings - Computers and Digital Techniques ◽

10.1049/ip-cdt:19960065 ◽

1996 ◽

Vol 143 (1) ◽

pp. 17

Author(s):

M.H. Abd-El-Barr ◽

C. McCrosky ◽

W. Li

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Technique

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PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.63 ◽

2008 ◽

Author(s):

Yi-Tsung Lin ◽

Meng-Fan Wu ◽

Jiun-Lang Huang

Keyword(s):

Power Supply ◽

Test Pattern ◽

Pattern Generation ◽

Huffman Coding ◽

Test Pattern Generation ◽

Scan Testing ◽

Test Compression ◽

Generation Technique ◽

Supply Noise ◽

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A Test Pattern Generation Technique for Approximate Circuits Based on an ILP-Formulated Pattern Selection Procedure

IEEE Transactions on Nanotechnology ◽

10.1109/tnano.2019.2923040 ◽

2019 ◽

Vol 18 ◽

pp. 849-857 ◽

Author(s):

Marcello Traiola ◽

Arnaud Virazel ◽

Patrick Girard ◽

Mario Barbareschi ◽

Alberto Bosio

Keyword(s):

Test Pattern ◽

Selection Procedure ◽

Pattern Generation ◽

Pattern Selection ◽

Test Pattern Generation ◽

Generation Technique

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An IR-drop guided test pattern generation technique

2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2016.7482581 ◽

2016 ◽

Author(s):

Li-Chen Tsai ◽

Jiun-Zong Li ◽

Yi-Tsung Lin ◽

Jiun-Lang Huang ◽

Ann Shih ◽

...

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Ir Drop ◽

Generation Technique

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Test pattern generation for logic crosstalk faults in VLSI circuits

IEE Proceedings G Circuits Devices and Systems ◽

10.1049/ip-g-2.1991.0034 ◽

1991 ◽

Vol 138 (2) ◽

pp. 179 ◽

Author(s):

A. Rubio ◽

J.A. Sainz ◽

K. Kinoshita

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Vlsi Circuits ◽

Test Pattern Generation

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Test the S27 Benchmark Circuit by Using Built In Self Test and Test Pattern Generation

International Journal of Advanced Research in Electrical Electronics and Instrumentation Engineering ◽

10.15662/ijareeie.2014.0308083 ◽

2014 ◽

Vol 03 (08) ◽

pp. 11487-11495

Author(s):

S. Nagaraju ◽

Ch.N.L. Sujatha ◽

J.S.S. Ramaraju

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Benchmark Circuit ◽

Self Test ◽

Built In Self Test

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Machine Intelligence for Efficient Test Pattern Generation

2020 IEEE International Test Conference (ITC) ◽

10.1109/itc44778.2020.9325250 ◽

2020 ◽

Author(s):

Soham Roy ◽

Spencer K. Millican ◽

Vishwani D. Agrawal

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Machine Intelligence ◽

Test Pattern Generation ◽

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An automatic test pattern generation framework for combinational threshold logic networks

IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. ◽

10.1109/iccd.2004.1347974 ◽

2004 ◽

Author(s):

P. Gupta ◽

Rui Zhang ◽

N.K. Jha

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Threshold Logic ◽

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Analysis of optimization algorithms in automated test pattern generation for sequential circuits

2017 IEEE International Conference on Systems, Man, and Cybernetics (SMC) ◽

10.1109/smc.2017.8122883 ◽

2017 ◽

Author(s):

Majed M. Alateeq ◽

Witold Pedrycz

Keyword(s):

Test Pattern ◽

Optimization Algorithms ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

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Test power reduction and test pattern generation for multiple faults using zero suppressed decision diagrams

International Journal of High Performance Systems Architecture ◽

10.1504/ijhpsa.2016.076204 ◽

2016 ◽

Vol 6 (1) ◽

pp. 51 ◽

Author(s):

J.P. Anita ◽

P. Sudheesh

Keyword(s):

Test Pattern ◽

Power Reduction ◽

Pattern Generation ◽

Test Pattern Generation ◽

Decision Diagrams ◽

Multiple Faults ◽

Test Power Reduction

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Automatic test pattern generation can be solved as a constraint satisfaction problem

Microprocessing and Microprogramming ◽

10.1016/0165-6074(93)90216-8 ◽

1993 ◽

Vol 38 (1-5) ◽

pp. 715-722

Author(s):

K. Tilly ◽

L. Surján ◽

G. Román

Keyword(s):

Constraint Satisfaction ◽

Test Pattern ◽

Constraint Satisfaction Problem ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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