The impact of an external body-bias on the hot-carrier degradation of partially depleted SOI N-MOSFETs at cryogenic temperatures

2002 ◽  
Author(s):  
F. Dieudonne ◽  
J. Jomaah ◽  
C. Raynaud ◽  
F. Balestra
Keyword(s):  
Cryogenic Temperatures ◽  
Hot Carrier ◽  
The Impact ◽  
External Body ◽  
Hot Carrier Degradation ◽  
Body Bias

THE IMPACT OF DIFFERENT HOT-CARRIER-DEGRADATION COMPONENTS ON THE OPTIMIZATION OF SUBMICRON n-CHANNEL LDD TRANSISTORS

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-787-C4-790
Author(s):  
P. T.J. BIERMANS ◽  
T. POORTER ◽  
H. J.H. MERKS-EPPINGBROEK
Keyword(s):  
Hot Carrier ◽  
The Impact ◽  
Hot Carrier Degradation

The impact of gate to drain spacing on hot-carrier degradation in sub-100nm Ni–Pt salicidation FinFETs

2015 ◽  
Vol 114 ◽  
pp. 167-170
Author(s):  
Seung Min Lee ◽  
Hi-Deok Lee ◽  
Injo Ok ◽  
Jungwoo Oh
Keyword(s):  
Hot Carrier ◽  
Drain Spacing ◽  
The Impact ◽  
Hot Carrier Degradation
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