The impact of an external body-bias on the hot-carrier degradation of Partially Depleted SOI N-MOSFETs at cryogenic temperatures
2002 ◽
Vol 12
(3)
◽
pp. 11-14
◽
Keyword(s):
Keyword(s):
1988 ◽
Vol 49
(C4)
◽
pp. C4-787-C4-790
Keyword(s):
Keyword(s):