Improvement of the stability of hydrogenated amorphous silicon films and solar cells by light pulse treatment

1989 ◽  
Vol 54 (13) ◽  
pp. 1226-1228 ◽  
Author(s):  
W. A. Nevin ◽  
H. Yamagishi ◽  
Y. Tawada
1995 ◽  
Vol 78 (1) ◽  
pp. 317-320 ◽  
Author(s):  
J. P. Kleider ◽  
C. Longeaud ◽  
M. Barranco‐Diaz ◽  
P. Morin ◽  
P. Roca i Cabarrocas

1989 ◽  
Vol 115 (1-3) ◽  
pp. 48-50 ◽  
Author(s):  
W.A. Nevin ◽  
H. Yamagishi ◽  
K. Asaoka ◽  
M. Yamaguchi ◽  
Y. Tawada

2006 ◽  
Vol 20 (14) ◽  
pp. 2035-2047 ◽  
Author(s):  
Q. S. LEI ◽  
Z. M. WU ◽  
J. P. XI ◽  
X. H. GENG ◽  
Y. ZHAO ◽  
...  

Highly stable hydrogenated amorphous silicon (a- Si:H ) films were developed by very high frequency plasma enhanced chemical vapor deposition (VHF PECVD). Their electrical and structural properties were studied. The films were applied as i-layers for p-i-n solar cells. The stability of intrinsic films as well as solar cells was studied. Results suggest that a- Si:H films prepared at high hydrogen dilution ratio (R) and low plasma power (PW) have low hydrogen content (CH) and small microstructure factor (RH) and show high stability against light illumination. The device with i-layer prepared at PW=5 W and R=10 shows a high stability with degradation in fill factor and efficiency of 3.23% and 11.64%, respectively, over 1000 hours illumination. However, the device with i-layer prepared at higher plasma power (PW=25 W ) and lower hydrogen dilution ratio (R=5) was much less stable. The stability of the devices is directly related to the stability of the intrinsic materials.


2016 ◽  
Vol 28 (28) ◽  
pp. 5939-5942 ◽  
Author(s):  
Rongrui He ◽  
Todd D. Day ◽  
Justin R. Sparks ◽  
Nichole F. Sullivan ◽  
John V. Badding

2014 ◽  
Vol 4 (6) ◽  
pp. 1331-1336 ◽  
Author(s):  
Jimmy Melskens ◽  
Marc Schouten ◽  
Awital Mannheim ◽  
Albert S. Vullers ◽  
Yalda Mohammadian ◽  
...  

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