Scaling size distribution of oxide defects, trema‐fractal oxide layer, and breakdown statistics of metal‐oxide‐semiconductor devices
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2010 ◽
Vol 25
(4)
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pp. 045020
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2015 ◽
Vol 7
(4)
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pp. 331-333
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2009 ◽
Vol 27
(3)
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pp. 1261
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2011 ◽
Vol 32
(7)
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pp. 076001
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2010 ◽
Vol 242
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pp. 012010
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