scholarly journals Direct determination of the ambipolar diffusion length in strained InxGa1−xAs/InP quantum wells by cathodoluminescence

1993 ◽  
Vol 62 (19) ◽  
pp. 2411-2412 ◽  
Author(s):  
Robert B. Lee ◽  
Kerry J. Vahala ◽  
Chung‐En Zah ◽  
Rajaram Bhat
1989 ◽  
Vol 55 (16) ◽  
pp. 1647-1649 ◽  
Author(s):  
H. A. Zarem ◽  
P. C. Sercel ◽  
J. A. Lebens ◽  
L. E. Eng ◽  
A. Yariv ◽  
...  

1991 ◽  
Vol 219 ◽  
Author(s):  
M. Vieira ◽  
R. Martins ◽  
E. Fortunato ◽  
F. Soares ◽  
L. Guimaraes

ABSTRACTThe determination of the ambipolar diffusion length, L*, and the effective lifetime, τ*, in p/i and a-Si:H Schottky barriers (ITO/p/a-Si:H/Al-Si; Cr/a-Si:H/Cr/Ag) have been determined by Flying Spot Technique, FST. This technique consists in the transient analysis of the photocurrent/photopotential induced by a laser beam that moves perpendicularly to the structure with a constant motion ratio, at different velocities. Taking into account the competition between the diffusion/drift velocities of the excess carriers and the velocity of the flying spot, it is possible to solve the transport equations and to compute separately L* and τ*, from the asymmetrical distribution responses.


1990 ◽  
Vol 192 ◽  
Author(s):  
Yuan-Min Li

ABSTRACTA general photoconductivity formula is derived for the case of a semiconductor steady state photocarrier grating (SSPG)1. It is shown that, under the condition of weak applied electric field, the ambipolar diffusion length can be determined by the SSPG technique1without the lifetime-regime restriction2,3 if the lifetime of photocarriers is known. The general formula presented here is reduced to the simple lifetime-regime formula1–3 under the condition of fast dielectric relaxation.


1993 ◽  
Vol 48 (24) ◽  
pp. 18031-18036 ◽  
Author(s):  
D. Patel ◽  
M. J. Hafich ◽  
G. Y. Robinson ◽  
C. S. Menoni

2000 ◽  
Vol 77 (12) ◽  
pp. 1843 ◽  
Author(s):  
P. N. Hai ◽  
W. M. Chen ◽  
I. A. Buyanova ◽  
H. P. Xin ◽  
C. W. Tu

2002 ◽  
Vol 80 (5) ◽  
pp. 761-762 ◽  
Author(s):  
K. Watanabe ◽  
Jer-Ren Yang ◽  
N. Nakanishi ◽  
K. Inoke ◽  
M. Shiojiri

1961 ◽  
Vol 41 (4) ◽  
pp. 380-384 ◽  
Author(s):  
Arthur F. Dratz ◽  
James C. Coberly
Keyword(s):  

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