A portable ultrahigh vacuum organic molecular beam deposition system for in situ x-ray diffraction measurements

2001 ◽  
Vol 72 (2) ◽  
pp. 1453 ◽  
Author(s):  
K. A. Ritley ◽  
B. Krause ◽  
F. Schreiber ◽  
H. Dosch
Keyword(s):  
Molecular Beam ◽  
Ultrahigh Vacuum ◽  
X Ray Diffraction ◽  
X Ray ◽  
Molecular Beam Deposition ◽  
Beam Deposition

Interfacial Superstructures Studied by Grazing Incidence X-Ray Diffraction

1989 ◽  
Vol 159 ◽  
Author(s):  
Koichi Akimoto ◽  
Jun'Ichiro Mizuki ◽  
Ichiro Hirosawa ◽  
Junji Matsui
Keyword(s):  
Synchrotron Radiation ◽  
Direct Observation ◽  
Molecular Beam ◽  
Solid Phase ◽  
Grazing Incidence ◽  
Deposition Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Molecular Beam Deposition ◽  
Beam Deposition

ABSTRACTSurface superstructures (reconstructed structures) have been observed by many authors. However, it is not easy to confirm that a superstructure does exist at an interface between two solid layers. The present paper reports a direct observation, by a grazing incidence x-ray diffraction technique with use of synchrotron radiation, of superstructures at the interface. Firstly, the boron-induced R30° reconstruction at the Si interface has been investigated. At the a Si/Si(111) interface, boron atoms at 1/3 ML are substituted for silicon atoms, thus forming a R30° lattice. Even at the interface between a solid phase epitaxial Si(111) layer and a Si(111) substrate, the boron-induced R30° reconstruction has been also observed. Secondly, SiO2/Si(100)-2×l interfacial superstructures have been investigated. Interfacial superstructures have been only observed in the samples of which SiO2 layers have been deposited with a molecular beam deposition method. Finally, the interfaces of MOCVD-grown AIN/GaAs(100) have been shown to have 1×4 and 1×6 superstructures.

In situ X-ray characterization of oligophenylene thin films prepared by organic molecular beam deposition

1998 ◽  
Vol 130-132 ◽  
pp. 651-657 ◽  
Author(s):  
Yuji Yoshida ◽  
Hiroshi Takiguchi ◽  
Takeshi Hanada ◽  
Nobutaka Tanigaki ◽  
Eun Mi Han ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Beam ◽  
X Ray ◽  
Molecular Beam Deposition ◽  
Beam Deposition

Molecular multilayers: structure and templating effects

2000 ◽  
Vol 620 ◽  
Author(s):  
Sandrine Heutz ◽  
Sallie M. Bayliss ◽  
Rudi Cloots ◽  
Ruth L. Middleton ◽  
Garry Rumbles ◽  
...  
Keyword(s):  
Molecular Beam ◽  
Double Layers ◽  
X Ray Diffraction ◽  
Multilayered Structures ◽  
X Ray ◽  
Metal Free ◽  
Molecular Beam Deposition ◽  
Polymorphic Forms ◽  
Templating Effect ◽  
Beam Deposition

ABSTRACTPowder X-Ray diffraction (XRD) has been used to study multilayered structures grown by, organic molecular beam deposition based on the molecular materials PTCDA and metal-free phthalocyanine (H2Pc). Double layers of different polymorphic forms (α, β1 and β2) of H2Pc indicate that the structure of the second layer is determined by the properties of the first layer. It is also shown that the first layer completely disrupts the crystallinity of the second layer in heterostructures containing PTCDA and H2Pc. The implication is that a strong templating effect occurs during the growth of multilayer molecular thin film structures.

Ultrahigh-vacuum organic molecular-beam deposition system for in situ growth and characterization

2018 ◽  
Vol 25 (6) ◽  
pp. 1658-1663 ◽  
Author(s):  
Emilia Annese ◽  
Joacir E. dos Santos ◽  
Gustavo Lorencini M. P. Rodrigues ◽  
Andre Silva Rocha ◽  
Horacio Ribeiro de Moraes ◽  
...  
Keyword(s):  
Molecular Beam ◽  
Film Growth ◽  
Ultrahigh Vacuum ◽  
Film Deposition ◽  
Buffer Layers ◽  
Specimen Preparation ◽  
Organic Thin Film ◽  
Molecular Beam Deposition ◽  
Beam Deposition

A compact ultrahigh-vacuum molecular-beam deposition system has been developed for the in situ synthesis of organic thin films and multilayers. The system incorporates all the features (heater, thickness monitor, evaporators) necessary for controlled organic thin-film growth. It can be used independently, or it can be docked to the in situ growth system and transferred to other instruments of the PGM beamline, thus allowing extensive film preparation and characterization. A manipulator dedicated to specimen preparation and organic-film deposition with temperature control between 200 K and ∼800 K has been developed. The design and performance of the system are reported with emphasis on a novel solution of masks developed to achieve position-dependent film deposition. To demonstrate the enhanced capabilities of the PGM beamline in the growth and in the characterization of electronic-structure studies of organic molecular films and their heterostructures through synchrotron-based spectroscopies, this paper presents some preliminary results of a study of Fe-phthalocyanine growth on Si substrates and on in situ prepared La0.67Sr0.33MnO3 buffer layers on SrTiO3 single crystal.

A Study on the Growth of Cubic GaN Films Using an AlGaAs Buffer Layer Grown on GaAs (100) by Plasma-Assisted Molecular Beam Epitaxy

2000 ◽  
Vol 639 ◽  
Author(s):  
Ryuhei Kimura ◽  
Kiyoshi Takahashi ◽  
H. T. Grahn
Keyword(s):  
Molecular Beam Epitaxy ◽  
Buffer Layer ◽  
Molecular Beam ◽  
High Energy ◽  
Rf Plasma ◽  
Cubic Phase ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cubic Gan

ABSTRACTAn investigation of the growth mechanism for RF-plasma assisted molecular beam epitaxy of cubic GaN films using a nitrided AlGaAs buffer layer was carried out by in-situ reflection high energy electron diffraction (RHEED) and high resolution X-ray diffraction (HRXRD). It was found that hexagonal GaN nuclei grow on (1, 1, 1) facets during nitridation of the AlGaAs buffer layer, but a highly pure, cubic-phase GaN epilayer was grown on the nitrided AlGaAs buffer layer.

Ultrahigh‐vacuum four‐circle diffractometer for grazing incidence x‐ray diffraction on in situ MBE grown III‐V semiconductor surfaces

1989 ◽  
Vol 60 (7) ◽  
pp. 2369-2372 ◽  
Author(s):  
P. Claverie ◽  
J. Massies ◽  
R. Pinchaux ◽  
M. Sauvage‐Simkin ◽  
J. Frouin ◽  
...  
Keyword(s):  
Ultrahigh Vacuum ◽  
Grazing Incidence ◽  
Semiconductor Surfaces ◽  
X Ray Diffraction ◽  
X Ray

In situ observation of the in-plane structure of C60 thin films on metal substrates prepared by molecular beam deposition

1996 ◽  
Vol 281-282 ◽  
pp. 80-83 ◽  
Author(s):  
Yuji Yoshida ◽  
Nobutaka Tanigaki ◽  
Kiyoshi Yase
Keyword(s):  
Thin Films ◽  
Molecular Beam ◽  
In Situ Observation ◽  
Metal Substrates ◽  
Molecular Beam Deposition ◽  
Beam Deposition

The growth of thin films with high thickness uniformity using ultrahigh vacuum molecular beam deposition

1990 ◽  
Vol 8 (6) ◽  
pp. 3934-3937 ◽  
Author(s):  
C. H. Hale ◽  
I. T. Muirhead ◽  
S. P. Fisher ◽  
J. S. Orr ◽  
J. G. H. Mathew ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Beam ◽  
Ultrahigh Vacuum ◽  
Thickness Uniformity ◽  
Molecular Beam Deposition ◽  
Beam Deposition
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