Correlation between channel mobility and shallow interface traps in SiC metal–oxide–semiconductor field-effect transistors
2012 ◽
Vol 51
(2)
◽
pp. 02BC09
◽
Keyword(s):
2006 ◽
Vol 45
(9A)
◽
pp. 6830-6836
◽
2011 ◽
Vol 679-680
◽
pp. 338-341
◽
2008 ◽
Vol 600-603
◽
pp. 791-794
◽
2007 ◽
Vol 46
(No. 25)
◽
pp. L599-L601
◽
Keyword(s):