Visualization of buried SiGe quantum dots at cleavages by cross-sectional atomic force microscopy

2004 ◽  
Vol 85 (11) ◽  
pp. 1999-2001 ◽  
Author(s):  
M. S. Dunaevskii ◽  
A. N. Titkov ◽  
Z. F. Krasilnik ◽  
A. V. Novikov ◽  
D. N. Lobanov ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Cross Sectional ◽  
Force Microscopy ◽  
Atomic Force

Cross-sectional atomic force microscopy of ZnMgSSe- and BeMgZnSe-based laser diodes

1999 ◽  
Vol 75 (17) ◽  
pp. 2626-2628 ◽  
Author(s):  
A. V. Ankudinov ◽  
A. N. Titkov ◽  
T. V. Shubina ◽  
S. V. Ivanov ◽  
P. S. Kop’ev ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Laser Diodes ◽  
Cross Sectional ◽  
Force Microscopy ◽  
Atomic Force

Cross-sectional observation of NaClO stain-etched Al0.5Ga0.5As/GaAs multilayer by atomic force microscopy

1995 ◽  
Vol 30 (3) ◽  
pp. 678-682 ◽  
Author(s):  
Hee Jeen Kim ◽  
Jae Sung Kim ◽  
Yong Kim ◽  
Moo Sung Kim ◽  
Suk-Ki Min
Keyword(s):  
Atomic Force Microscopy ◽  
Cross Sectional ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy Studies of DNA-Wrapped Carbon Nanotube Structure and Binding to Quantum Dots

2008 ◽  
Vol 130 (32) ◽  
pp. 10648-10655 ◽  
Author(s):  
Jennifer F. Campbell ◽  
Ingrid Tessmer ◽  
H. Holden Thorp ◽  
Dorothy A. Erie
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Force Microscopy ◽  
Atomic Force

Chemical and Structural Analysis of Nitridated Sapphire

1997 ◽  
Vol 482 ◽  
Author(s):  
Y. Cho ◽  
S. Rouvimov ◽  
Y. Kim ◽  
Z. Liliental-Weber ◽  
E. R. Weber
Keyword(s):  
Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Structural Analysis ◽  
Photoelectron Spectroscopy ◽  
High Resolution Electron Microscopy ◽  
Cross Sectional ◽  
Force Microscopy ◽  
Sapphire Substrates ◽  
Atomic Force ◽  
Resolution Electron

AbstractThe incorporation of nitrogen into sapphire substrates during nitridation was studied by xray photoelectron spectroscopy (XPS). An increase in the intensity of nitrogen 1s peak in XPS was observed upon longer nitridation. The surface morphology of the substrates was characterized by atomic force microscopy (AFM). High resolution electron microscopy (HREM) was employed for structural analysis. The cross sectional TEM showed a thin layer of AlN buried between amorphous AlNxO1−x and sapphire. This is the first direct observation of AlN on sapphire. The TEM images show a deeper penetration depth of nitrogen into a longer nitridated sapphire.

Atomic force microscopy of InAs quantum dots on the vicinal surface of a GaAs crystal

2002 ◽  
Vol 28 (2) ◽  
pp. 139-141
Author(s):  
V. P. Evtikhiev ◽  
O. V. Konstantinov ◽  
E. Yu. Kotel’nikov ◽  
A. V. Matveentsev ◽  
A. N. Titkov ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Vicinal Surface ◽  
Gaas Crystal ◽  
Inas Quantum Dots ◽  
Force Microscopy ◽  
Atomic Force
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