Comment on “Influence of indium-tin-oxide thin-film quality on reverse leakage current of indium-tin-oxide/n-GaN Schottky contacts” [Appl. Phys. Lett. 89, 033503 (2006)]
Keyword(s):
Keyword(s):
Keyword(s):
1994 ◽
Vol 33
(Part 1, No. 12B)
◽
pp. 7057-7060
◽
Keyword(s):
2016 ◽
Vol 63
(3)
◽
pp. 1072-1077
◽
Keyword(s):
Keyword(s):
Keyword(s):
2019 ◽
Vol 1371
◽
pp. 012018
Keyword(s):