Binary-collision modeling of ion-induced stress relaxation in cubic BN and amorphous C thin films

2007 ◽  
Vol 90 (18) ◽  
pp. 181910 ◽  
Author(s):  
B. Abendroth ◽  
H. U. Jäger ◽  
W. Möller ◽  
M. Bilek
Keyword(s):  
Thin Films ◽  
Stress Relaxation ◽  
Binary Collision ◽  
Induced Stress

Moisture-induced stress relaxation of polyimide thin films

Polymer ◽  
2001 ◽  
Vol 42 (1) ◽  
pp. 319-328 ◽  
Author(s):  
H. Chung ◽  
C. Lee ◽  
H. Han
Keyword(s):  
Thin Films ◽  
Stress Relaxation ◽  
Induced Stress

Hydrogenography of PdHx thin films: Influence of H-induced stress relaxation processes

2009 ◽  
Vol 57 (4) ◽  
pp. 1209-1219 ◽  
Author(s):  
R. Gremaud ◽  
M. Gonzalez-Silveira ◽  
Y. Pivak ◽  
S. de Man ◽  
M. Slaman ◽  
...  
Keyword(s):  
Thin Films ◽  
Stress Relaxation ◽  
Relaxation Processes ◽  
Induced Stress

Thermally induced stress relaxation and densification of spin-on-glass thin films

2000 ◽  
Vol 76 (4) ◽  
pp. 430-432 ◽  
Author(s):  
C. K. Chiang ◽  
W. E. Wallace ◽  
G. W. Lynn ◽  
D. Feiler ◽  
W. Xia
Keyword(s):  
Thin Films ◽  
Stress Relaxation ◽  
Thermally Induced ◽  
Induced Stress

Stress Relaxation and the Formation of Silicides in the Process of the Crystallization of NI-NB Films on SI

1991 ◽  
Vol 49 ◽  
pp. 898-899
Author(s):  
N. Rozhanski ◽  
V. Lifshitz
Keyword(s):  
Thin Films ◽  
Stress Relaxation ◽  
Integrated Circuits ◽  
Direct Evidence ◽  
Alloy Film ◽  
Diffusion Barriers ◽  
Effective Barrier

Thin films of amorphous Ni-Nb alloys are of interest since they can be used as diffusion barriers for integrated circuits on Si. A native SiO2 layer is an effective barrier for Ni diffusion but it deformation during the crystallization of the alloy film lead to the appearence of diffusion fluxes through it and the following formation of silicides. This study concerns the direct evidence of the action of stresses in the process of the crystallization of Ni-Nb films on Si and the structure of forming NiSi2 islands.

Irradiation-induced stress relaxation of Eurofer97 steel

2011 ◽  
Vol 417 (1-3) ◽  
pp. 104-107 ◽  
Author(s):  
N.V. Luzginova ◽  
M. Jong ◽  
J.W. Rensman ◽  
J.B.J. Hegeman ◽  
J.G. van der Laan
Keyword(s):  
Stress Relaxation ◽  
Induced Stress

scholarly journals Kinetics and mechanisms of stress relaxation in sputtered silver thin films

2021 ◽  
pp. 117385
Author(s):  
Quentin Hérault ◽  
Iryna Gozhyk ◽  
Matteo Balestrieri ◽  
Hervé Montigaud ◽  
Sergey Grachev ◽  
...  
Keyword(s):  
Thin Films ◽  
Stress Relaxation ◽  
Silver Thin Films
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