Direct observation of 90° domain switching in lead zirconate titanate thick films using x-ray diffraction

2007 ◽  
Vol 90 (26) ◽  
pp. 262905 ◽  
Author(s):  
Satoko Osone ◽  
Yoshiro Shimojo ◽  
Kyle Brinkman ◽  
Takashi Iijima ◽  
Keisuke Saito
Keyword(s):  
Direct Observation ◽  
Lead Zirconate Titanate ◽  
Domain Switching ◽  
Thick Films ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zirconate Titanate

Contribution from Ferroelastic Domain Switching Detected Using X-ray Diffraction toR-Curves in Lead Zirconate Titanate Ceramics

2001 ◽  
Vol 84 (12) ◽  
pp. 2921-2929 ◽  
Author(s):  
Alexandre E. Glazounov ◽  
Hans Kungl ◽  
Jan-Thorsten Reszat ◽  
Michael J. Hoffmann ◽  
Arnd Kolleck ◽  
...  
Keyword(s):  
Lead Zirconate Titanate ◽  
Domain Switching ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zirconate Titanate ◽  
Titanate Ceramics

Characterization of Lead Zirconate Titanate Powders Prepared by a Hydrothermal Method

2005 ◽  
Vol 902 ◽  
Author(s):  
Lingjuan Che ◽  
Yongping Ding ◽  
Jinrong Cheng ◽  
Chao Chen ◽  
Zhongyan Meng
Keyword(s):  
Electron Microscopy ◽  
Hydrothermal Method ◽  
Lead Zirconate Titanate ◽  
Fourier Transformation ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zirconate Titanate ◽  
Scanning Electron

AbstractLead Zirconate Titanate (PZT) powders have been synthesized by a hydrothermal method at the processing temperatures of 120-220 °C for 1.5-50 hours, based on the reaction of Pb(CH3COOH)2·3H2O, ZrOCl2·8H2O, Ti(C4H9O)4 and KOH. Hydrothermally treated PZT powders were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM), and Fourier transformation infrared (FTIR) techniques respectively. The influences of hydrothermal synthesize conditions on the crystalline structure and the morphology of PZT particles were investigated. Crystallized PZT powders could be synthesized at the KOH concentration of >2.5 mol/l.

scholarly journals In situ X-ray diffraction of lead zirconate titanate piezoMEMS cantilever during actuation

2016 ◽  
Vol 111 ◽  
pp. 429-434 ◽  
Author(s):  
Giovanni Esteves ◽  
Chris M. Fancher ◽  
Margeaux Wallace ◽  
Raegan Johnson-Wilke ◽  
Rudeger H.T. Wilke ◽  
...  
Keyword(s):  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zirconate Titanate

scholarly journals Piezoelectric Properties of Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 Thin Films Studied by In Situ X-ray Diffraction

Materials ◽  
2020 ◽  
Vol 13 (15) ◽  
pp. 3338
Author(s):  
Thomas W. Cornelius ◽  
Cristian Mocuta ◽  
Stéphanie Escoubas ◽  
Luiz R. M. Lima ◽  
Eudes B. Araújo ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Fields ◽  
Lead Zirconate Titanate ◽  
Piezoelectric Properties ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ac Electric Fields ◽  
Zirconate Titanate

The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 thin films, with x = 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electric fields, with AC frequencies covering more than four orders of magnitude. The Bragg reflections for thin films with low lanthanum concentration exhibit a double-peak structure, indicating two contributions, whereas thin films with 12% La possess a well-defined Bragg peak with a single component. In addition, built-in electric fields are revealed for low La concentrations, while they are absent for thin films with 12% of La. For static and low frequency AC electric fields, all lanthanum-modified lead zirconate titanate thin films exhibit butterfly loops, whereas linear piezoelectric behavior is found for AC frequencies larger than 1 Hz.

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