Electronic trap characterization of the Sc2O3∕La2O3 high-κ gate stack by scanning tunneling microscopy
2000 ◽
Vol 194-195
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pp. 129-136
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2016 ◽
Vol 42
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pp. 14-46
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1990 ◽
pp. 1093-1099
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1999 ◽
Vol 147
(1-4)
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pp. 140-145
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2012 ◽
Vol 51
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pp. 08KB06
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Keyword(s):
1991 ◽
Vol 9
(2)
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pp. 1263
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