Atomic force microscope imaging and force measurements at electrified and actively corroding interfaces: Challenges and novel cell design

2011 ◽  
Vol 82 (2) ◽  
pp. 023703 ◽  
Author(s):  
Markus Valtiner ◽  
Genesis Ngwa Ankah ◽  
Asif Bashir ◽  
Frank Uwe Renner
Langmuir ◽  
2009 ◽  
Vol 25 (11) ◽  
pp. 6203-6213 ◽  
Author(s):  
Eric Karhu ◽  
Mark Gooyers ◽  
Jeffrey L. Hutter

Molecules ◽  
2003 ◽  
Vol 8 (1) ◽  
pp. 86-91 ◽  
Author(s):  
Jiye Cai ◽  
Yao Chen ◽  
Qingcai Xu ◽  
Yong Chen ◽  
Tao Zhao ◽  
...  

2001 ◽  
Vol 2 (2) ◽  
pp. 105-108 ◽  
Author(s):  
Thomas Kaasgaard ◽  
Chad Leidy ◽  
John Hjort Ipsen ◽  
Ole G. Mouritsen ◽  
Kent Jørgensen

2010 ◽  
Vol 25 (11) ◽  
pp. 2231-2239 ◽  
Author(s):  
S. DE MAN ◽  
K. HEECK ◽  
K. SMITH ◽  
R. J. WIJNGAARDEN ◽  
D. IANNUZZI

We present a short overview of the recent efforts of our group in the design of high precision Casimir force setups. We first describe our Atomic Force Microscope based technique that allows one to simultaneously and continuously calibrate the instrument, compensate for a residual electrostatic potential, measure the Casimir force, and, in the presence of a fluid in the gap between the interacting surfaces, measure the hydrodynamic force. Then we briefly discuss a new force sensor that adapts well to Casimir force measurements in critical environments.


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