Epifilm thickness measurements using Fourier transform infrared spectroscopy: Effect of refractive index dispersion and refractive index measurement

1994 ◽  
Vol 76 (4) ◽  
pp. 2448-2454 ◽  
Author(s):  
Zhen‐Hong Zhou ◽  
Byungin Choi ◽  
M. I. Flik ◽  
S. Fan ◽  
Rafael Reif
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