Shot Noise Modeling in Metal-Oxide-Semiconductor Field Effect Transistors under Sub-Threshold Condition
2007 ◽
Vol E90-C
(4)
◽
pp. 885-894
◽
Y. ISOBE
◽
K. HARA
◽
D. NAVARRO
◽
Y. TAKEDA
◽
T. EZAKI
◽
...
2011 ◽
Vol 98
(19)
◽
pp. 193502
◽
Katsuhiko Nishiguchi
◽
Yukinori Ono
◽
Akira Fujiwara
2018 ◽
Vol 57
(6S1)
◽
pp. 06HD03
◽
Yongxun Liu
◽
Hiroyuki Tanaka
◽
Norio Umeyama
◽
Kazuhiro Koga
◽
Sommawan Khumpuang
◽
...
2006 ◽
Vol 100
(7)
◽
pp. 074108
◽
Chih-Hsiang Hsu
◽
Ming-Tsong Wang
◽
Joseph Ya-Min Lee
Ryosho Nakane
◽
Shoichi Sato
◽
Masaaki Tanaka
2020 ◽
Vol 8
◽
pp. 9-14
◽
Ching-Sung Lee
◽
Yan-Ting Shen
◽
Wei-Chou Hsu
◽
Yi-Ping Huang
◽
Cheng-Yang You
2007 ◽
Vol 46
(4B)
◽
pp. 2054-2057
◽
Syunichi Watabe
◽
Shigetoshi Sugawa
◽
Akinobu Teramoto
◽
Tadahiro Ohmi
2019 ◽
Vol 12
(6)
◽
pp. 061003
◽
Kidist Moges
◽
Takuji Hosoi
◽
Takayoshi Shimura
◽
Heiji Watanabe
2009 ◽
Vol 48
(4)
◽
pp. 04C100
◽
Yuki Nakano
◽
Toshikazu Mukai
◽
Ryota Nakamura
◽
Takashi Nakamura
◽
Akira Kamisawa
2009 ◽
Vol 48
(9)
◽
pp. 091404
◽
Rino Choi
◽
Tea Wan Kim
◽
Hokyung Park
◽
Byoung Hun Lee
2001 ◽
Vol 90
(2)
◽
pp. 866-870
◽