Influences of damage and contamination from reactive ion etching on selective tungsten deposition in a low‐pressure chemical‐vapor‐deposition reactor

1996 ◽  
Vol 80 (5) ◽  
pp. 3056-3061
Author(s):  
Kow‐Ming Chang ◽  
Ta‐Hsun Yeh ◽  
Shih‐Wei Wang ◽  
Chii‐Horng Li
2003 ◽  
Vol 804 ◽  
Author(s):  
Lijuan Zhong ◽  
Fang Chen ◽  
Stephen A. Campbell ◽  
Wayne L. Gladfelter

ABSTRACTA modified low-pressure chemical vapor deposition reactor was used to create compositional spreads of MO2/SiO2 films (M = Hf, Zr and Sn) using tri(t-butoxy) silanol and anhydrous metal nitrates of hafnium, zirconium and tin at temperatures below 250 °C. The compositional spreads formed by this process were characterized by ellipsometry and Rutherford backscattering spectrometry. A survey of possible reactions involved in the deposition is included.


1994 ◽  
Vol 76 (5) ◽  
pp. 3130-3139 ◽  
Author(s):  
T. G. M. Oosterlaken ◽  
G. J. Leusink ◽  
G. C. A. M. Janssen ◽  
S. Radelaar ◽  
K. J. Kuijlaars ◽  
...  

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