Strain and lattice orientation distribution in SiN/Ge complementary metal–oxide–semiconductor compatible light emitting microstructures by quick x-ray nano-diffraction microscopy
2007 ◽
Vol 46
(4B)
◽
pp. 2474-2480
◽
1995 ◽
Vol 13
(6)
◽
pp. 2741
◽
2015 ◽
Vol 86
(8)
◽
pp. 086107
◽
2012 ◽
Vol 2
(1)
◽
pp. 021211
◽
1996 ◽
Vol 14
(6)
◽
pp. 4024
1993 ◽
Vol 11
(6)
◽
pp. 2910
◽