scholarly journals Nano-crystallization in ZnO-doped In2O3 thin films via excimer laser annealing for thin-film transistors

AIP Advances ◽  
2016 ◽  
Vol 6 (6) ◽  
pp. 065216 ◽  
Author(s):  
Mami N. Fujii ◽  
Yasuaki Ishikawa ◽  
Ryoichi Ishihara ◽  
Johan van der Cingel ◽  
Mohammad R. T. Mofrad ◽  
...  
1990 ◽  
Vol 29 (Part 2, No. 10) ◽  
pp. L1775-L1777 ◽  
Author(s):  
Kazuhiro Shimizu ◽  
Osamu Sugiura ◽  
Masakiyo Matsumura

1994 ◽  
Vol 33 (Part 1, No. 4A) ◽  
pp. 2092-2099 ◽  
Author(s):  
Genshiro Kawachi ◽  
Takashi Aoyama ◽  
Akio Mimura ◽  
Nobutake Konishi

1993 ◽  
Vol 32 (Part 1, No. 1B) ◽  
pp. 474-481 ◽  
Author(s):  
Ichirou Asai ◽  
Noriji Kato ◽  
Mario Fuse ◽  
Toshihisa Hamano

2009 ◽  
Vol 48 (8) ◽  
pp. 081608 ◽  
Author(s):  
Mitsuru Nakata ◽  
Kazushige Takechi ◽  
Toshimasa Eguchi ◽  
Eisuke Tokumitsu ◽  
Hirotaka Yamaguchi ◽  
...  

1994 ◽  
Vol 33 (Part 1, No. 10) ◽  
pp. 5657-5662 ◽  
Author(s):  
Hiroyuki Kuriyama ◽  
Tomoyuki Nohda ◽  
Yoichirou Aya ◽  
Takashi Kuwahara ◽  
Kenichiro Wakisaka ◽  
...  

2013 ◽  
Vol 811 ◽  
pp. 177-180
Author(s):  
Jyh Liang Wang ◽  
Chun Chien Tsai ◽  
Chuan Chou Hwang ◽  
Tsang Yen Hsieh

High performance and device uniformity n-channel low-temperature poly-silicon (LTPS) bottom-gate (BG) thin film transistors (TFTs) with artificially-controlled lateral grain growth have been performed by excimer laser crystallization (ELC). The BG TFTs (W/L = 1.5 μm/1.5 μm) demonstrate field-effect-mobility of 323 cm2/Vs and high Ion/Ioff of 9.5 × 108. The proposed BG TFTs reveal the superior electrical characteristics, device uniformity, and reliability than conventional top-gate ones.


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