scholarly journals Very large remanent polarization in ferroelectric Hf1-xZrxO2 grown on Ge substrates by plasma assisted atomic oxygen deposition

2019 ◽  
Vol 114 (11) ◽  
pp. 112901 ◽  
Author(s):  
C. Zacharaki ◽  
P. Tsipas ◽  
S. Chaitoglou ◽  
S. Fragkos ◽  
M. Axiotis ◽  
...  
2017 ◽  
Vol 110 (11) ◽  
pp. 112902 ◽  
Author(s):  
Ningtao Liu ◽  
Ruihong Liang ◽  
Zhen Liu ◽  
Zhiyong Zhou ◽  
Chenhong Xu ◽  
...  

2003 ◽  
Vol 82 (26) ◽  
pp. 4761-4763 ◽  
Author(s):  
Hitoshi Morioka ◽  
Gouji Asano ◽  
Takahiro Oikawa ◽  
Hiroshi Funakubo ◽  
Keisuke Saito

2013 ◽  
Vol 42 (2) ◽  
pp. 585-590 ◽  
Author(s):  
Linxing Zhang ◽  
Jun Chen ◽  
Hanqing Zhao ◽  
Longlong Fan ◽  
Yangchun Rong ◽  
...  

2001 ◽  
Vol 16 (11) ◽  
pp. 3124-3132 ◽  
Author(s):  
Uong Chon ◽  
Hyun M. Jang ◽  
Sun-Hwa Lee ◽  
Gyu-Chul Yi

Highly c-axis-oriented Bi3.25La0.75Ti3O12 (BLT) films with a homogeneous in-plane orientation were successfully grown on SiO2/Si(100) and Pt/Ti/SiO2/Si(100) substrates by a sol-coating route. The substitution of lanthanum ions for bismuth ions in the layered perovskite suppressed the formation of pyrochlore phase and enhanced the c-axis-oriented growth. The c-axis-oriented BLT film fabricated on a Pt/Ti/SiO2/Si(100) substrate showed fatigue-free characteristics with a large remanent polarization of 26–28 μC/cm2 and the coercive field of 50–75 kV/cm. These features significantly enhance the potential value of the BLT film for the applications to high-density ferroelectric random-access memories devices. In addition, the c-axis-oriented BLT film, with a homogeneous in-plane orientation on an amorphous surface, can be used as a suitable template material for applications to various electro-magneto-optic devices.


2002 ◽  
Vol 92 (3) ◽  
pp. 1518-1521 ◽  
Author(s):  
Takayuki Watanabe ◽  
Takashi Kojima ◽  
Tomohiro Sakai ◽  
Hiroshi Funakubo ◽  
Minoru Osada ◽  
...  

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Yuuki Kitanaka ◽  
Yuji Noguchi ◽  
Masaru Miyayama

AbstractWe report the robust ferroelectric properties of (1 − x)(Bi1/2Na1/2)TiO3–x(Bi1/2K1/2)TiO3 (x = 33%) single crystals grown by a top-seeded solution growth process under a high oxygen-pressure (0.9 MPa) atmosphere. The sample exhibit a large remanent polarization of 48 μC/cm2 and a sizeable piezoelectric strain constant of 460 pm/V. Neutron powder diffraction structural analysis combined with first-principles calculations reveals that the large ferroelectric polarization comparable to PbTiO3 stems from the hybridization between Bi-6p and O-2p orbitals at a moderately negative chemical pressure.


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