The interaction between the supersonic molecular beam and electron beam for the optimization of an electron ionization ion source

2019 ◽  
Vol 90 (10) ◽  
pp. 103308
Author(s):  
D. Liu ◽  
G. F. Qu ◽  
Y. Z. Wang ◽  
M. L. Zhou ◽  
M. Li ◽  
...  
1967 ◽  
Vol 22 (2) ◽  
pp. 121-123 ◽  
Author(s):  
C. Brunnée

A new combined field ionisation/electron impact ion source is described which can be used in connection with a direct inlet probe. The distance between the electron beam and the wire emitter is only one mm, sot hat the vapour of the sample reaches both ionizing zones. The vapour passes the ion source as a quasi molecular beam. Results obtained with this source will be given.


Author(s):  
Dudley M. Sherman ◽  
Thos. E. Hutchinson

The in situ electron microscope technique has been shown to be a powerful method for investigating the nucleation and growth of thin films formed by vacuum vapor deposition. The nucleation and early stages of growth of metal deposits formed by ion beam sputter-deposition are now being studied by the in situ technique.A duoplasmatron ion source and lens assembly has been attached to one side of the universal chamber of an RCA EMU-4 microscope and a sputtering target inserted into the chamber from the opposite side. The material to be deposited, in disc form, is bonded to the end of an electrically isolated copper rod that has provisions for target water cooling. The ion beam is normal to the microscope electron beam and the target is placed adjacent to the electron beam above the specimen hot stage, as shown in Figure 1.


1988 ◽  
Vol 49 (C4) ◽  
pp. C4-607-C4-614
Author(s):  
R. J. MALIK ◽  
A. F.J. LEVI ◽  
B. F. LEVINE ◽  
R. C. MILLER ◽  
D. V. LANG ◽  
...  

2013 ◽  
Vol 8 (0) ◽  
pp. 1402066-1402066 ◽  
Author(s):  
Linge ZANG ◽  
Nobuhiro NISHINO ◽  
Tohru MIZUUCHI ◽  
Shinsuke OHSHIMA ◽  
Masaki TAKEUCHI ◽  
...  

2020 ◽  
Vol 75 (13) ◽  
pp. 1685-1692
Author(s):  
D. M. Mazur ◽  
M. E. Zimens ◽  
Th. B. Latkin ◽  
N. V. Ul’yanovskii ◽  
V. B. Artaev ◽  
...  

1988 ◽  
Vol 152 (1) ◽  
pp. 87-93 ◽  
Author(s):  
K. McMillan ◽  
D. Bender ◽  
M. Eliades ◽  
D. Danzeiser ◽  
B.A. Wofford ◽  
...  

1994 ◽  
Vol 65 (5) ◽  
pp. 1766-1769 ◽  
Author(s):  
Hiroyuki Kawano ◽  
Katsushi Ohgami ◽  
Kiyohiko Funato ◽  
Junji Nakamura

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