scholarly journals Secondary electron emission characteristics of Al2O3 coatings prepared by atomic layer deposition

AIP Advances ◽  
2019 ◽  
Vol 9 (9) ◽  
pp. 095303 ◽  
Author(s):  
Junjiang Guo ◽  
Dan Wang ◽  
Yantao Xu ◽  
Xiangping Zhu ◽  
Kaile Wen ◽  
...  



2021 ◽  
Vol 11 (11) ◽  
pp. 4801
Author(s):  
Xiangping Zhu ◽  
Junjiang Guo ◽  
Xiangxin Li ◽  
Rundong Zhou ◽  
Dan Wang ◽  
...  

MgO is a kind of high secondary electron yield (SEY) material with important applications in electron multipliers. MgO coatings can be used as the electron emission layer for multiplier dynode to improve the electron gain significantly. However, the SEY investigation on ultrathin MgO coatings is not complete and needed to be supplemented urgently. In this work, a series of MgO coatings with increasing thickness were prepared by atomic layer deposition. SEY properties and energy spectra were characterized, and the effect of coating thickness on SEY was systematically analyzed. Experimental results show that SEY of MgO/Si samples rises as the coating thickness increases. Merely, SEY almost does not change with the coating thickness when the thickness exceeds 30 nm. Then, a SEY semi-empirical theory was employed to interpret the SEY regularities of MgO coatings by regarding the coating samples as ideal double-layer structures. Theoretical calculation quantitatively explained the SEY variation observed during the experiments, and further quantified the SEY contribution level of top coating and bottom substrate for the 1 nm and 20 nm MgO coatings. The work is of great significance for comprehending the SEY of ultrathin MgO coatings and expanding the applications of nanoscale coatings with high SEY.





Author(s):  
Taewon Jeong ◽  
Jeonghee Lee ◽  
SeGi Yu ◽  
Sunghwan Jin ◽  
Jungna Heo ◽  
...  


2012 ◽  
Vol 7 (04) ◽  
pp. E04002-E04002 ◽  
Author(s):  
J S Lapington ◽  
V Taillandier ◽  
B L Cann ◽  
J Howorth ◽  
J Milnes


1998 ◽  
Vol 509 ◽  
Author(s):  
J.E. Yater ◽  
A. Shih

AbstractSecondary electron emission spectroscopy is used to examine the emission characteristics of diamond films as a function of the bulk and surface properties. We find significant variation in the secondary electron yields measured from diamond surfaces even when energy distribution measurements indicate that a low or negative electron affinity is present. In particular, we observe that the material properties, such as bulk and surface uniformity, surface composition, and impurity and defect concentrations, have a strong affect on the secondary electron yield measurements. Furthermore, the energy distribution of the emitted electrons is found to vary with adsorbate species. In certain cases, the energy distribution changes with adsorbate coverage even though the measured electron intensity remains unchanged. From an analysis of the data, we identify bulk and surface properties needed to optimize the emission characteristics.



Sign in / Sign up

Export Citation Format

Share Document