scholarly journals Substructure of Wool Cortical Cells

1971 ◽  
Vol 24 (4) ◽  
pp. 1355 ◽  
Author(s):  
CA Anderson ◽  
JD Leeder
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Resolving Power ◽  
Specimen Preparation ◽  
Cortical Cells ◽  
Transmission Electron ◽  
Very High

The morphology of wool fibres and their components has been studied mainly with the optical and transmission electron microscope. In the former, the specimen is observed directly but the resolution is poor; in the latter, the resolving power is very high but the introduction of artefacts during specimen preparation and the indirect nature of the data obtained lead to possible uncertainties in interpretation.

The Effect of Focused Ion Beam (Fib) Specimen Geometry on X-Ray Fluorescence During Energy Dispersive X-Ray Spectroscopy (EDS) Analysis in the Transmission Electron Microscope (TEM)

1998 ◽  
Vol 4 (S2) ◽  
pp. 856-857
Author(s):  
David M. Longo ◽  
James M. Howe ◽  
William C. Johnson
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Focused Ion Beam ◽  
Materials Science ◽  
Bulk Material ◽  
Ion Beam ◽  
Energy Dispersive ◽  
Specimen Preparation ◽  
X Ray ◽  
Transmission Electron

The focused ion beam (FIB) has become an indispensable tool for a variety of applications in materials science, including that of specimen preparation for the transmission electron microscope (TEM). Several FIB specimen preparation techniques have been developed, but some problems result when FIB specimens are analyzed in the TEM. One of these is X-ray fluorescence from bulk material surrounding the thin membrane in FIB-prepared samples. This paper reports on a new FIB specimen preparation method which was devised for the reduction of X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) in the TEM.Figure 1 shows three membrane geometries that were investigated in this study on a single-crystal Si substrate with a RF sputter-deposited 50 nm Ni film. Membrane 1 is the most commonly reported geometry in the literature, with an approximately 20 urn wide trench and a membrane having a single wedge with a 1.5° incline.

scholarly journals Rapid Cross-Section TEM Specimen Preparation of III-V Materials

2003 ◽  
Vol 11 (1) ◽  
pp. 29-32 ◽  
Author(s):  
R. Beanland
Keyword(s):  
Electron Microscope ◽  
Cross Section ◽  
Transmission Electron Microscope ◽  
Limited Resources ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Sample Type ◽  
Transmission Electron ◽  
Conventional Methods ◽  
The Cross

AbstractCross-section transmission electron microscope (TEM) specimen preparation of Ill-V materials using conventional methods can be a painful and time-consuming activity, with a day or more from receipt of a sample to examination in the TEM being the norm. This article describes the cross-section TEM specimen preparation technique used at Bookham Caswell. The usual time from start to finish is <1 hour. Up to 10 samples can be prepared at once, depending upon sample type. Most of the tools used are widely available and inexpensive, making the technique ideal for use in institutions with limited resources.

A Technique for Preparing Transmission Electron Microscope Specimens Using Cleavage

1987 ◽  
Vol 115 ◽  
Author(s):  
T. Boone ◽  
S. Nakahara
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Cross Sections ◽  
Specimen Preparation ◽  
Plan View ◽  
Transmission Electron ◽  
Thinning Operation ◽  
Thin Electron ◽  
Reflection Electron Microscopy ◽  
Transparent Region

ABSTRACTA technique for observing both plan view and cross sections of a specimen directly in a transmission electron microscope (TEM) without relying on a tedious thinning operation was developed. This technique involves cleaving a specimen perpendicular to the plane, so that the thin (electron transparent) section of the cleaved edge can be directly imaged by TEM. The only limitations of this technique are that a specimen must be readily criacked or cleaved and that, since the transparent region is often bounded by a 90° corner, the extent of electron transparent region is somewhat localized. Nevertheless, the technique has the advantages of the ease of specimen preparation, and the absence of contamination or damage introduced in other conventional thinning methods. The geometry of the cleaved specimen is also suitable for reflection electron microscopy.

Application of the Short Focal Length Objective to Biological Substances

1967 ◽  
Vol 25 ◽  
pp. 224-225
Author(s):  
W. W Harri
Keyword(s):  
Molecular Structure ◽  
Electron Microscope ◽  
Serum Albumin ◽  
Plasma Protein ◽  
Transmission Electron Microscope ◽  
Focal Length ◽  
Resolving Power ◽  
Transmission Electron ◽  
Short Focal Length ◽  
Conventional Transmission Electron Microscope

Possible improvement in resolving power by use of objective focal lengths of 2 mm in the conventional transmission electron microscope has been described by Heidenreich and Armbruster and by H. Fernandez-Moran. A modified Siemens Elmiskop IA has been used to examine a plasma protein, some polyamino acids, sRNA, 50s ribosome preparations, serum albumin, and myoglobin in unsupported specimens.Characteristics of the images obtained in defocussed images will be discussed in relation to the molecular structure of these compounds.

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