A new approach to visualizing the membranous structures of the inner ear – high resolution X-ray micro-tomography

2007 ◽  
Vol 127 (6) ◽  
pp. 568-573 ◽  
Author(s):  
Hilal Uzun ◽  
Ian S. Curthoys ◽  
>Allan S. Jones
Keyword(s):  
High Resolution ◽  
Inner Ear ◽  
New Approach ◽  
X Ray ◽  
Micro Tomography

scholarly journals Fractal Dimension Analysis of High-Resolution X-Ray Phase Contrast Micro-Tomography Images at Different Threshold Levels in a Mouse Spinal Cord

2018 ◽  
Vol 3 (4) ◽  
pp. 48 ◽  
Author(s):  
Laura Maugeri ◽  
Mauro DiNuzzo ◽  
Marta Moraschi ◽  
Charles Nicaise ◽  
Inna Bukreeva ◽  
...  
Keyword(s):  
Spinal Cord ◽  
Fractal Dimension ◽  
High Resolution ◽  
Fractal Analysis ◽  
Phase Contrast ◽  
Threshold Level ◽  
Mouse Spinal Cord ◽  
X Ray ◽  
Threshold Levels ◽  
Micro Tomography

Fractal analysis is a powerful method for the morphological study of complex systems that is increasingly applied to biomedical images. Spatial resolution and image segmentation are crucial for the discrimination of tissue structures at the multiscale level. In this work, we have applied fractal analysis to high-resolution X-ray phase contrast micro-tomography (XrPCμT) images in both uninjured and injured tissue of a mouse spinal cord. We estimated the fractal dimension (FD) using the box-counting method on tomographic slices segmented at different threshold levels. We observed an increased FD in the ipsilateral injured hemicord compared with the contralateral uninjured tissue, which was almost independent of the chosen threshold. Moreover, we found that images exhibited the highest fractality close to the global histogram threshold level. Finally, we showed that the FD estimate largely depends on the image histogram regardless of tissue appearance. Our results demonstrate that the pre-processing of XrPCμT images is critical to fractal analysis and the estimation of FD.

Visualisation by high resolution synchrotron X-ray phase contrast micro-tomography of gas films on submerged superhydrophobic leaves

2014 ◽  
Vol 188 (1) ◽  
pp. 61-70 ◽  
Author(s):  
Torsten Lauridsen ◽  
Kyriaki Glavina ◽  
Timothy David Colmer ◽  
Anders Winkel ◽  
Sarah Irvine ◽  
...  
Keyword(s):  
High Resolution ◽  
Phase Contrast ◽  
X Ray ◽  
Micro Tomography

scholarly journals Unit-cell determination of epitaxial thin films based on reciprocal-space vectors by high-resolution X-ray diffractometry

2014 ◽  
Vol 47 (1) ◽  
pp. 402-413 ◽  
Author(s):  
Ping Yang ◽  
Huajun Liu ◽  
Zuhuang Chen ◽  
Lang Chen ◽  
John Wang
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Indium Tin Oxide ◽  
Unit Cell ◽  
Reciprocal Space ◽  
Lattice Parameters ◽  
Epitaxial Thin Films ◽  
New Approach ◽  
X Ray ◽  
Space Vectors

A new approach, based on reciprocal-space vectors (RSVs), is developed to determine Bravais lattice types and accurate lattice parameters of epitaxial thin films by high-resolution X-ray diffractometry. The lattice parameters of single-crystal substrates are employed as references to correct the systematic experimental errors of RSVs of thin films. The general procedure is summarized, involving correction of RSVs, derivation of the raw unit cell, and subsequent conversion to the Niggli unit cell and the Bravais unit cell by matrix calculation. Two methods of this procedure are described: in three-dimensional reciprocal space and in six-dimensionalG6space. The estimation of standard error in the lattice parameters derived by this new approach is discussed. The whole approach is illustrated by examples of experimental data. The error of the best result is 0.0006 Å for the lattice parameter of indium tin oxide film. This new RSV method provides a practical and concise route to the crystal structure study of epitaxial thin films and could also be applied to the investigation of surface and interface structures.

Non-invasive imaging of roots with high resolution X-ray micro-tomography

2003 ◽  
Vol 255 (1) ◽  
pp. 351-359 ◽  
Author(s):  
P.J. Gregory ◽  
D. J. Hutchison ◽  
D. B. Read ◽  
P. M. Jenneson ◽  
W. B. Gilboy ◽  
...  
Keyword(s):  
High Resolution ◽  
X Ray ◽  
Non Invasive ◽  
Micro Tomography

scholarly journals Inner ear morphology of diadectomorphs and seymouriamorphs (Tetrapoda) uncovered by high‐resolution x‐ray microcomputed tomography, and the origin of the amniote crown group

Palaeontology ◽  
2019 ◽  
Vol 63 (1) ◽  
pp. 131-154 ◽  
Author(s):  
Jozef Klembara ◽  
Miroslav Hain ◽  
Marcello Ruta ◽  
David S Berman ◽  
Stephanie E. Pierce ◽  
...  
Keyword(s):  
High Resolution ◽  
Inner Ear ◽  
Microcomputed Tomography ◽  
Crown Group ◽  
X Ray ◽  
Ear Morphology

Non Invasive Failure Analysis of Passive Electronic Devices in Wireless Modules Using X-ray Micro Tomography (MicroCT)

2008 ◽  
Author(s):  
Tyler Pendleton ◽  
Luke Hunter ◽  
S. H. Lau
Keyword(s):  
High Resolution ◽  
Failure Analysis ◽  
Electronic Devices ◽  
Interesting Case ◽  
X Rays ◽  
X Ray ◽  
Case Examples ◽  
Non Invasive ◽  
Novel Approach ◽  
Micro Tomography

Abstract Conventional microCTs or 3D x-ray upgrades from existing 2D x-ray systems have two major drawbacks when they are used for failure analysis of advanced packages: Insufficient resolution to image small (1 to 5 microns) materials and the lack of imaging contrast to visualize cracks, whiskers, and defects within low Z materials. This paper discusses some of the failure analysis (FA) case studies of wireless modules using a high resolution micro x-ray CT (XCT). These examples show the value of high resolution XCT as a novel approach to some common package level defects, including some interesting case examples, where failure mechanisms have been uncovered which could not have been done, using conventional means. The non-invasive FA technique for RF modules technique has been shown to dramatically improve the FA engineers' chances of identifying defects over conventional 2D x-rays and avoid the need for physical and tedious cross sectioning of these devices.

High Resolution X‐ray Micro‐Tomography of the Posterior Ampullary Nerve

2018 ◽  
Vol 32 (S1) ◽  
Author(s):  
Marc LABROUSSE ◽  
Delphine BLANCHOT ◽  
Xavier DUBERNARD ◽  
Nicla SETTEMBRE ◽  
Claude AVISSE ◽  
...  
Keyword(s):  
High Resolution ◽  
X Ray ◽  
Micro Tomography

Visualizing wood anatomy in three dimensions with high-resolution X-ray micro-tomography (μCT ) – a review –

IAWA Journal ◽  
2013 ◽  
Vol 34 (4) ◽  
pp. 408-424 ◽  
Author(s):  
Craig R. Brodersen
Keyword(s):  
High Resolution ◽  
Wood Anatomy ◽  
Data Extraction ◽  
Three Dimensional ◽  
Cell Types ◽  
Extraction Process ◽  
Three Dimensions ◽  
Wood Structures ◽  
X Ray ◽  
Micro Tomography

High-resolution X-ray micro-tomography (μCT) has emerged as one of the most promising new tools available to wood anatomists to study the three-dimensional organization of xylem networks. This non-destructive method faithfully reproduces the spatial relationships between the different cell types and allows the user to explore wood anatomy in new and innovative ways. With μCT imaging, the sample can be visualized in any plane and is not limited to a single section or exposed plane. Conventional CT software aids in the visualization of wood structures, and newly developed custom software can be used to rapidly automate the data extraction process, thereby accelerating the rate at which samples can be analyzed for research. In this review the origins of xylem reconstructions using traditional methods are discussed, as well as the current applications of μCT in plant biology and an overview of pertinent technical considerations associated with this technique. μCT imaging offers a new perspective on wood anatomy and highlights the importance of the relationships between wood structure and function.

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