Some Forensic Case Histories Involving the Optical Microscope

AbstractThis study highlights the importance of insect evidence by evaluating 949 insect-associated cases, including 139 entomological reports, from 2001 to 2019 at the Institute of Legal Medicine Frankfurt/Germany. With a high number of cases in the summer months and a low number in the colder season, 78.5% of the bodies were found indoors, regardless of year or month. In more than 80% of the cases, where PMI information was available (n = 704), the presumed PMI ranged from 1 to 21 days, a period during which entomological evidence can provide a day-specific estimate of PMImin. In cases where insects have been identified to species level (n = 279), most bodies were infested by one or two species with a maximum of 10 different species. Overall, a total of 55 insect species were found. Information on biology, activity and distribution of the most abundant taxa is given and applied for 5 case histories estimating different PMImins of up to over 6 months. Despite proved importance and scientific development of forensic entomology, insects are still rarely considered as a tool in forensic case work. The main reasons are a lack of awareness and (too) late involvement of a forensic entomologist. Our work shows that forensic entomology is an independent discipline that requires specialist expertise.

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Further Case Histories Involving the Optical Microscope

Australian Journal of Forensic Sciences ◽

10.1080/00450618409410692 ◽

1984 ◽

Vol 16 (3) ◽

pp. 93-103

Author(s):

Lister G. Clark

Keyword(s):

Optical Microscope ◽

Case Histories

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Some early history of replica techniques for electron microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100130018 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1076-1077

Author(s):

Robert M. Fisher

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Optical Microscope ◽

Early History ◽

Bulk Materials ◽

Thin Sections ◽

Transmission Electron ◽

Reflected Light ◽

History Of ◽

Electron Microscopes

By 1940, a half dozen or so commercial or home-built transmission electron microscopes were in use for studies of the ultrastructure of matter. These operated at 30-60 kV and most pioneering microscopists were preoccupied with their search for electron transparent substrates to support dispersions of particulates or bacteria for TEM examination and did not contemplate studies of bulk materials. Metallurgist H. Mahl and other physical scientists, accustomed to examining etched, deformed or machined specimens by reflected light in the optical microscope, were also highly motivated to capitalize on the superior resolution of the electron microscope. Mahl originated several methods of preparing thin oxide or lacquer impressions of surfaces that were transparent in his 50 kV TEM. The utility of replication was recognized immediately and many variations on the theme, including two-step negative-positive replicas, soon appeared. Intense development of replica techniques slowed after 1955 but important advances still occur. The availability of 100 kV instruments, advent of thin film methods for metals and ceramics and microtoming of thin sections for biological specimens largely eliminated any need to resort to replicas.

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Near-field scanning optical microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100144644 ◽

1986 ◽

Vol 44 ◽

pp. 642-643

Author(s):

E. Betzig ◽

A. Harootunian ◽

M. Isaacson ◽

A. Lewis

Keyword(s):

Near Field ◽

Optical Microscope ◽

Visible Radiation ◽

Field Methods ◽

Optical Elements ◽

Optical Region ◽

Order Of Magnitude ◽

Nondestructive Imaging ◽

Scanning Optical Microscopy ◽

Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

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Principles of Low-Vacuum SEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100131152 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1304-1305

Author(s):

Klaus-Ruediger Peters

Keyword(s):

New Technologies ◽

High Vacuum ◽

Optical Microscope ◽

Specimen Surface ◽

Electrical Field ◽

Gaseous Environment ◽

New Information ◽

Gas Molecules ◽

New Interactions ◽

Gas Pressures

Only recently it became possible to expand scanning electron microscopy to low vacuum and atmospheric pressure through the introduction of several new technologies. In principle, only the specimen is provided with a controlled gaseous environment while the optical microscope column is kept at high vacuum. In the specimen chamber, the gas can generate new interactions with i) the probe electrons, ii) the specimen surface, and iii) the specimen-specific signal electrons. The results of these interactions yield new information about specimen surfaces not accessible to conventional high vacuum SEM. Several microscope types are available differing from each other by the maximum available gas pressure and the types of signals which can be used for investigation of specimen properties.Electrical non-conductors can be easily imaged despite charge accumulations at and beneath their surface. At high gas pressures between 10-2 and 2 torr, gas molecules are ionized in the electrical field between the specimen surface and the surrounding microscope parts through signal electrons and, to a certain extent, probe electrons. The gas provides a stable ion flux for a surface charge equalization if sufficient gas ions are provided.

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A correlation of CL emissions from Penrith sandstone with elemental distributions obtained by simultaneous SEM-CL and EDS analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100138336 ◽

1995 ◽

Vol 53 ◽

pp. 392-393

Author(s):

Paul J. Wright

Keyword(s):

Optical Microscope ◽

Electron Gun ◽

High Electron ◽

Collection System ◽

Electron Hole ◽

Depositional Processes ◽

Eds Analysis ◽

Distribution Mapping ◽

Backscattered Electron ◽

Electron Imaging

Most industrial and academic geologists are familiar with the beautiful red and orange cathodoluminescence colours produced by carbonate minerals in an optical microscope with a cold cathode electron gun attached. The cement stratigraphies interpreted from colour photographs have been widely used to determine the post depositional processes which have modified sedimentary rock textures.However to study quartzose materials high electron densities and kV's are necessary to stimulate sufficient emission. A scanning electron microscope with an optical collection system and monochromator provides an adequate tool and gives the advantage of providing secondary and backscattered electron imaging as well as elemental analysis and distribution mapping via standard EDS/WDS facilities.It has been known that the incorporation of many elements modify the characteristics of the CL emissions from geological materials. They do this by taking up positions between the valence and conduction band thus providing sites to assist in the recombination of electron hole pairs.

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Cosmetology treatments on human hair: An SEM study

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100167160 ◽

1996 ◽

Vol 54 ◽

pp. 940-941

Author(s):

D.F. Bowling

Keyword(s):

High School ◽

High Resolution ◽

Human Hair ◽

Optical Microscope ◽

Convincing Evidence ◽

Brightness Contrast ◽

Sem Study

High school cosmetology students study the methods and effects of various human hair treatments, including permanents, straightening, conditioning, coloring and cutting. Although they are provided with textbook examples of overtreatment and numerous hair disorders and diseases, a view of an individual hair at the high resolution offered by an SEM provides convincing evidence of the hair‘s altered structure. Magnifications up to 2000X provide dramatic differences in perspective. A good quality classroom optical microscope can be very informative at lower resolutions.Students in a cosmetology class are initially split into two groups. One group is taught basic controls on the SEM (focus, magnification, brightness, contrast, specimen X, Y, and Z axis movements). A healthy, untreated piece of hair is initially examined on the SEM The second group cements a piece of their own hair on a stub. The samples are dryed quickly using heat or vacuum while the groups trade places and activities.

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Selective Corrosion of brazed joint between BNi-2 filler metal and stainless steel 316

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100163551 ◽

1996 ◽

Vol 54 ◽

pp. 218-219

Author(s):

H. S. Kim ◽

R. U. Lee

Keyword(s):

Stainless Steel ◽

Filler Metal ◽

Surface Preparation ◽

Optical Microscope ◽

Heating Element ◽

Incomplete Fusion ◽

Atmospheric Conditions ◽

Leak Test ◽

High Temperature Side ◽

Inconel 600

A heating element/electrical conduit assembly used in the Orbiter Maneuvering System failed a leak test during a routine refurbishment inspection. The conduit, approximately 100 mm in length and 12 mm in diameter, was fabricated from two tubes and braze-joined with a sleeve. The tube on the high temperature side (heating element side) and the sleeve were made of Inconel 600 and the other tube was stainless steel (SS) 316. For the filler metal, a Ni-Cr-B brazing alloy per AWS BNi-2, was used. A Helium leak test spotted the leak located at the joint between the sleeve and SS 316 tubing. This joint was dissected, mounted in a plastic mold, polished, and examined with an optical microscope. Debonding of the brazed surfaces was noticed, more pronounced toward the sleeve end which was exposed to uncontrolled atmospheric conditions intermittently. Initially, lack of wetting was suspected, presumably caused by inadequate surface preparation or incomplete fusion of the filler metal. However, this postulation was later discarded based upon the following observations: (1) The angle of wetting between the fillet and tube was small, an indication of adequate wetting, (2) the fillet did not exhibit a globular microstructure which would be an indication of insufficient melting of the filler metal, and (3) debonding was intermittent toward the midsection of the sleeve.

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