Spectroscopic Ellipsometry Study of Thin Film of Gold Iodide with Stearylammonium

Takehito Kodzasa; Hirobumi Ushijima; Toshihide Kamata

doi:10.1080/10587250008024879

Spectroscopic Ellipsometry Study of Thin Film of Gold Iodide with Stearylammonium

Molecular Crystals and Liquid Crystals Science and Technology Section A Molecular Crystals and Liquid Crystals ◽

10.1080/10587250008024879 ◽

2000 ◽

Vol 349 (1) ◽

pp. 115-118

Author(s):

Takehito Kodzasa ◽

Hirobumi Ushijima ◽

Toshihide Kamata

Keyword(s):

Thin Film ◽

Spectroscopic Ellipsometry

Download Full-text

Retraction: “Depth Profile Characterization of Spin-Coated Poly(3,4-ethylenedioxythiophene):Poly(styrene sulfonic acid) Films for Thin-Film Solar Cells during Argon Plasma Etching by Spectroscopic Ellipsometry”

Japanese Journal of Applied Physics ◽

10.7567/jjap.55.089201 ◽

2016 ◽

Vol 55 (8) ◽

pp. 089201

Author(s):

Tomohisa Ino ◽

Tatsuya Hayashi ◽

Keiji Ueno ◽

Hajime Shirai

Keyword(s):

Thin Film ◽

Solar Cells ◽

Depth Profile ◽

Plasma Etching ◽

Spectroscopic Ellipsometry ◽

Sulfonic Acid ◽

Argon Plasma ◽

Thin Film Solar Cells ◽

Styrene Sulfonic Acid

Download Full-text

Spectroscopic ellipsometry characterization of thin film photovoltaic materials and devices

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) ◽

10.1109/pvsc.2013.6744416 ◽

2013 ◽

Author(s):

Michelle N. Sestak ◽

Li Yan ◽

Celine Eypert

Keyword(s):

Thin Film ◽

Spectroscopic Ellipsometry ◽

Photovoltaic Materials

Download Full-text

Thin‐film hermeticity: A quantitative analysis of diamondlike carbon using variable angle spectroscopic ellipsometry

Journal of Applied Physics ◽

10.1063/1.341331 ◽

1988 ◽

Vol 64 (8) ◽

pp. 4175-4180 ◽

Cited By ~ 16

Author(s):

S. Orzeszko ◽

Bhola N. De ◽

John A. Woollam ◽

John J. Pouch ◽

Samuel A. Alterovitz ◽

...

Keyword(s):

Thin Film ◽

Quantitative Analysis ◽

Spectroscopic Ellipsometry ◽

Variable Angle ◽

Diamondlike Carbon ◽

Variable Angle Spectroscopic Ellipsometry

Download Full-text

Ellipsometric study of the complex optical constants of a CsPbBr3 perovskite thin film

Journal of Materials Chemistry C ◽

10.1039/c8tc03222j ◽

2018 ◽

Vol 6 (39) ◽

pp. 10450-10455 ◽

Cited By ~ 22

Author(s):

Minglin Zhao ◽

Yujun Shi ◽

Jun Dai ◽

Jie Lian

Keyword(s):

Thin Film ◽

Spectroscopic Ellipsometry ◽

Optical Constants ◽

Interband Transitions ◽

Hybrid Perovskite ◽

Ellipsometric Study

Complex optical constants and interband transitions of a hybrid perovskite CsPbBr3 thin film measured by spectroscopic ellipsometry.

Download Full-text

Parallel spectroscopic ellipsometry for ultra-fast thin film characterization

Optics Express ◽

10.1364/oe.28.009288 ◽

2020 ◽

Vol 28 (7) ◽

pp. 9288 ◽

Cited By ~ 4

Author(s):

Andrey Nazarov ◽

Michael Ney ◽

Ibrahim Abdulhalim

Keyword(s):

Thin Film ◽

Spectroscopic Ellipsometry ◽

Thin Film Characterization

Download Full-text

Combination of Spectroscopic Ellipsometry and Transmittance for Measuring the Optical Constants of Transparent Layers: Application to a Pyrochlore PbZr$_{0.2}$Ti$_{0.8}$O$_3$ Thin Film on a SrTiO$_3$ Substrate

New Physics Sae Mulli ◽

10.3938/npsm.61.785 ◽

2011 ◽

Vol 61 (8) ◽

pp. 785-790

Author(s):

Yu-Seong SEO ◽

Dae-Young KWON ◽

Bog-Gi KIM ◽

Jai-Seok AHN* ◽

Il-Kyoung JEONG

Keyword(s):

Thin Film ◽

Spectroscopic Ellipsometry ◽

Optical Constants

Download Full-text

Spectroscopic Ellipsometry Investigation of CuInSe2 as a Narrow Bandgap Component of Thin Film Tandem Solar Cells

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) ◽

10.1109/pvsc.2018.8548177 ◽

2018 ◽

Author(s):

Dhurba R. Sapkota ◽

Prakash Koirala ◽

Puja Pradhan ◽

Niraj Shrestha ◽

Maxwell M. Junda ◽

...

Keyword(s):

Thin Film ◽

Solar Cells ◽

Spectroscopic Ellipsometry ◽

Tandem Solar Cells ◽

Narrow Bandgap

Download Full-text

Spectroscopic Ellipsometry Characterization of Pd Thin Film Grown by Atomic Layer Deposition

ECS Meeting Abstracts ◽

10.1149/ma2015-02/26/1003 ◽

2015 ◽

Keyword(s):

Thin Film ◽

Atomic Layer Deposition ◽

Spectroscopic Ellipsometry ◽

Atomic Layer ◽

Layer Deposition

Download Full-text

Determining the refractive index and the dielectric constant of PPDT2FBT thin film using spectroscopic ellipsometry

Optical Materials ◽

10.1016/j.optmat.2020.110445 ◽

2020 ◽

Vol 110 ◽

pp. 110445

Author(s):

Chandan Howlader ◽

Mehedhi Hasan ◽

Alex Zakhidov ◽

Maggie Yihong Chen

Keyword(s):

Thin Film ◽

Dielectric Constant ◽

Refractive Index ◽

Spectroscopic Ellipsometry

Download Full-text

Spectroscopic ellipsometry of thin film and bulk anatase (TiO2)

Journal of Applied Physics ◽

10.1063/1.1573737 ◽

2003 ◽

Vol 93 (12) ◽

pp. 9537-9541 ◽

Cited By ~ 190

Author(s):

G. E. Jellison ◽

L. A. Boatner ◽

J. D. Budai ◽

B.-S. Jeong ◽

D. P. Norton

Keyword(s):

Thin Film ◽

Spectroscopic Ellipsometry ◽

Anatase Tio2

Download Full-text